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@ARTICLE{Kovcs:201608,
author = {Kovács, A. and Schaffer, B. and Moreno, M. S. and
Jinschek, J. R. and Craven, A. J. and Dietl, T. and Bonanni,
A. and Dunin-Borkowski, Rafal},
title = {{C}haracterization of {F}e-{N} nanocrystals and
nitrogen–containing inclusions in ({G}a,{F}e){N} thin
films using transmission electron microscopy},
journal = {Journal of applied physics},
volume = {114},
number = {3},
issn = {0021-8979},
address = {Melville, NY},
publisher = {American Inst. of Physics},
reportid = {FZJ-2015-03902},
pages = {033530 -},
year = {2013},
abstract = {Nanometric inclusions filled with nitrogen, located
adjacent to Fe n N (n = 3 or 4) nanocrystals within
(Ga,Fe)N layers, are identified and characterized using
scanning transmission electron microscopy (STEM) and
electron energy-loss spectroscopy (EELS). High-resolution
STEM images reveal a truncation of the Fe-N nanocrystals at
their boundaries with the nitrogen-containing inclusions. A
controlled electron beam hole drilling experiment is used to
release nitrogen gas from an inclusion in situ in the
electron microscope. The density of nitrogen in an
individual inclusion is measured to be
1.4 ± 0.3 g/cm3. These observations provide an
explanation for the location of surplus nitrogen in the
(Ga,Fe)N layers, which is liberated by the nucleation of Fe
n N (n > 1) nanocrystals during growth.},
cin = {PGI-5},
ddc = {530},
cid = {I:(DE-Juel1)PGI-5-20110106},
pnm = {42G - Peter Grünberg-Centre (PG-C) (POF2-42G41)},
pid = {G:(DE-HGF)POF2-42G41},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000322202700045},
doi = {10.1063/1.4816049},
url = {https://juser.fz-juelich.de/record/201608},
}