%0 Journal Article
%A Mi, Shao-Bo
%T Interfacial defects in YBa $_{2}$ Cu $_{3}$ O $_{7-δ}$ /SrTiO $_{3} (0 0 1) heterostructures studied by aberration-corrected ultrahigh-resolution electron microscopy
%J Philosophical magazine  / Letters
%V 93
%N 5
%@ 1362-3036
%C London [u.a.]
%I Taylor & Francis
%M FZJ-2015-03909
%P 264 - 272
%D 2013
%X The microstructure of interfacial defects in YBa2Cu3O7-δ/SrTiO3(0 0 1) heterostructures has been investigated by aberration-corrected ultrahigh-resolution electron microscopy. We determine that c-axis-oriented YBa2Cu3O7-δ thin films epitaxially grow on SrTiO3(0 0 1) with two types of interface structure. The coalescence of nucleation sites with different types of interface structure leads to the formation of antiphase domain boundaries in YBa2Cu3O7-δ thin films, which terminate at planar faults with different configurations near the interface. Stand-off misfit dislocations are observed and the dislocation core structure is explored. Based on the interface structure and interfacial defects, the initial growth mode of YBa2Cu3O7-δ thin films on SrTiO3(0 0 1) is discussed.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000318763900002
%R 10.1080/09500839.2013.765975
%U https://juser.fz-juelich.de/record/201615