000201615 001__ 201615
000201615 005__ 20240610115607.0
000201615 0247_ $$2doi$$a10.1080/09500839.2013.765975
000201615 0247_ $$2ISSN$$a0950-0839
000201615 0247_ $$2ISSN$$a1362-3036
000201615 0247_ $$2WOS$$aWOS:000318763900002
000201615 037__ $$aFZJ-2015-03909
000201615 082__ $$a070
000201615 1001_ $$0P:(DE-HGF)0$$aMi, Shao-Bo$$b0$$eCorresponding Author
000201615 245__ $$aInterfacial defects in YBa $_{2}$ Cu $_{3}$ O $_{7-δ}$ /SrTiO $_{3} (0 0 1) heterostructures studied by aberration-corrected ultrahigh-resolution electron microscopy
000201615 260__ $$aLondon [u.a.]$$bTaylor & Francis$$c2013
000201615 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1435322501_21656
000201615 3367_ $$2DataCite$$aOutput Types/Journal article
000201615 3367_ $$00$$2EndNote$$aJournal Article
000201615 3367_ $$2BibTeX$$aARTICLE
000201615 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000201615 3367_ $$2DRIVER$$aarticle
000201615 520__ $$aThe microstructure of interfacial defects in YBa2Cu3O7-δ/SrTiO3(0 0 1) heterostructures has been investigated by aberration-corrected ultrahigh-resolution electron microscopy. We determine that c-axis-oriented YBa2Cu3O7-δ thin films epitaxially grow on SrTiO3(0 0 1) with two types of interface structure. The coalescence of nucleation sites with different types of interface structure leads to the formation of antiphase domain boundaries in YBa2Cu3O7-δ thin films, which terminate at planar faults with different configurations near the interface. Stand-off misfit dislocations are observed and the dislocation core structure is explored. Based on the interface structure and interfacial defects, the initial growth mode of YBa2Cu3O7-δ thin films on SrTiO3(0 0 1) is discussed.
000201615 536__ $$0G:(DE-HGF)POF2-424$$a424 - Exploratory materials and phenomena (POF2-424)$$cPOF2-424$$fPOF II$$x0
000201615 588__ $$aDataset connected to CrossRef, juser.fz-juelich.de
000201615 773__ $$0PERI:(DE-600)2008166-2$$a10.1080/09500839.2013.765975$$gVol. 93, no. 5, p. 264 - 272$$n5$$p264 - 272$$tPhilosophical magazine <London> / Letters$$v93$$x1362-3036$$y2013
000201615 909CO $$ooai:juser.fz-juelich.de:201615$$pVDB
000201615 9132_ $$0G:(DE-HGF)POF3-899$$1G:(DE-HGF)POF3-890$$2G:(DE-HGF)POF3-800$$aDE-HGF$$bForschungsbereich Materie$$lForschungsbereich Materie$$vohne Topic$$x0
000201615 9131_ $$0G:(DE-HGF)POF2-424$$1G:(DE-HGF)POF2-420$$2G:(DE-HGF)POF2-400$$3G:(DE-HGF)POF2$$4G:(DE-HGF)POF$$aDE-HGF$$bSchlüsseltechnologien$$lGrundlagen zukünftiger Informationstechnologien$$vExploratory materials and phenomena$$x0
000201615 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR
000201615 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000201615 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000201615 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000201615 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000201615 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000201615 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000201615 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences
000201615 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF <  5
000201615 920__ $$lyes
000201615 9201_ $$0I:(DE-Juel1)PGI-5-20110106$$kPGI-5$$lMikrostrukturforschung$$x0
000201615 980__ $$ajournal
000201615 980__ $$aVDB
000201615 980__ $$aI:(DE-Juel1)PGI-5-20110106
000201615 980__ $$aUNRESTRICTED
000201615 981__ $$aI:(DE-Juel1)ER-C-1-20170209