TY  - JOUR
AU  - Mi, Shao-Bo
TI  - Interfacial defects in YBa $_{2}$ Cu $_{3}$ O $_{7-δ}$ /SrTiO $_{3} (0 0 1) heterostructures studied by aberration-corrected ultrahigh-resolution electron microscopy
JO  - Philosophical magazine  / Letters
VL  - 93
IS  - 5
SN  - 1362-3036
CY  - London [u.a.]
PB  - Taylor & Francis
M1  - FZJ-2015-03909
SP  - 264 - 272
PY  - 2013
AB  - The microstructure of interfacial defects in YBa2Cu3O7-δ/SrTiO3(0 0 1) heterostructures has been investigated by aberration-corrected ultrahigh-resolution electron microscopy. We determine that c-axis-oriented YBa2Cu3O7-δ thin films epitaxially grow on SrTiO3(0 0 1) with two types of interface structure. The coalescence of nucleation sites with different types of interface structure leads to the formation of antiphase domain boundaries in YBa2Cu3O7-δ thin films, which terminate at planar faults with different configurations near the interface. Stand-off misfit dislocations are observed and the dislocation core structure is explored. Based on the interface structure and interfacial defects, the initial growth mode of YBa2Cu3O7-δ thin films on SrTiO3(0 0 1) is discussed.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000318763900002
DO  - DOI:10.1080/09500839.2013.765975
UR  - https://juser.fz-juelich.de/record/201615
ER  -