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@ARTICLE{Mi:201615,
author = {Mi, Shao-Bo},
title = {{I}nterfacial defects in {YB}a $_{2}$ {C}u $_{3}$ {O}
$_{7-δ}$ /{S}r{T}i{O} $_{3} (0 0 1) heterostructures
studied by aberration-corrected ultrahigh-resolution
electron microscopy},
journal = {Philosophical magazine / Letters},
volume = {93},
number = {5},
issn = {1362-3036},
address = {London [u.a.]},
publisher = {Taylor $\&$ Francis},
reportid = {FZJ-2015-03909},
pages = {264 - 272},
year = {2013},
abstract = {The microstructure of interfacial defects in
YBa2Cu3O7-δ/SrTiO3(0 0 1) heterostructures has been
investigated by aberration-corrected ultrahigh-resolution
electron microscopy. We determine that c-axis-oriented
YBa2Cu3O7-δ thin films epitaxially grow on
SrTiO3(0 0 1) with two types of interface structure. The
coalescence of nucleation sites with different types of
interface structure leads to the formation of antiphase
domain boundaries in YBa2Cu3O7-δ thin films, which
terminate at planar faults with different configurations
near the interface. Stand-off misfit dislocations are
observed and the dislocation core structure is explored.
Based on the interface structure and interfacial defects,
the initial growth mode of YBa2Cu3O7-δ thin films on
SrTiO3(0 0 1) is discussed.},
cin = {PGI-5},
ddc = {070},
cid = {I:(DE-Juel1)PGI-5-20110106},
pnm = {424 - Exploratory materials and phenomena (POF2-424)},
pid = {G:(DE-HGF)POF2-424},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000318763900002},
doi = {10.1080/09500839.2013.765975},
url = {https://juser.fz-juelich.de/record/201615},
}