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| 005 | 20240610115607.0 | ||
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| 100 | 1 | _ | |a Mi, Shao-Bo |0 P:(DE-HGF)0 |b 0 |e Corresponding Author |
| 245 | _ | _ | |a Interfacial defects in YBa $_{2}$ Cu $_{3}$ O $_{7-δ}$ /SrTiO $_{3} (0 0 1) heterostructures studied by aberration-corrected ultrahigh-resolution electron microscopy |
| 260 | _ | _ | |a London [u.a.] |c 2013 |b Taylor & Francis |
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| 520 | _ | _ | |a The microstructure of interfacial defects in YBa2Cu3O7-δ/SrTiO3(0 0 1) heterostructures has been investigated by aberration-corrected ultrahigh-resolution electron microscopy. We determine that c-axis-oriented YBa2Cu3O7-δ thin films epitaxially grow on SrTiO3(0 0 1) with two types of interface structure. The coalescence of nucleation sites with different types of interface structure leads to the formation of antiphase domain boundaries in YBa2Cu3O7-δ thin films, which terminate at planar faults with different configurations near the interface. Stand-off misfit dislocations are observed and the dislocation core structure is explored. Based on the interface structure and interfacial defects, the initial growth mode of YBa2Cu3O7-δ thin films on SrTiO3(0 0 1) is discussed. |
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| 773 | _ | _ | |a 10.1080/09500839.2013.765975 |g Vol. 93, no. 5, p. 264 - 272 |0 PERI:(DE-600)2008166-2 |n 5 |p 264 - 272 |t Philosophical magazine |v 93 |y 2013 |x 1362-3036 |
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