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@ARTICLE{Emmel:201871,
      author       = {Emmel, M. and Alfonsov, A. and Legut, D. and Kehlberger, A.
                      and Vilanova, E. and Krug, I. P. and Gottlob, D. M. and
                      Belesi, M. and Büchner, B. and Kläui, M. and Oppeneer, P.
                      M. and Wurmehl, S. and Elmers, H. J. and Jakob, G.},
      title        = {{E}lectronic properties of {C}o2{F}e{S}i investigated by
                      {X}-ray magnetic linear dichroism},
      journal      = {Journal of magnetism and magnetic materials},
      volume       = {368},
      issn         = {0304-8853},
      address      = {Amsterdam},
      publisher    = {North-Holland Publ. Co.},
      reportid     = {FZJ-2015-04165},
      pages        = {364 - 373},
      year         = {2014},
      abstract     = {We present experimental XMLD spectra measured on epitaxial
                      (001)-oriented thin Co2FeSi films, which are rich in
                      features and depend sensitively on the degree of atomic
                      order and interdiffusion from capping layers. Al- and
                      Cr-capped films with different degrees of atomic order were
                      prepared by DC magnetron sputtering by varying the
                      deposition temperatures. The local structural properties of
                      the film samples were additionally investigated by nuclear
                      magnetic resonance (NMR) measurements. The XMLD spectra of
                      the different samples show clear and uniform trends at the
                      L3,2L3,2 edges. The Al-capped samples show similar behavior
                      as previous measured XMLD spectra of Co2FeSi0.6Al0.4. Thus,
                      we assume that during deposition Al atoms are being
                      implanted into the subsurface of Co2FeSi. Such an
                      interdiffusion is not observed for the corresponding
                      Cr-capped films, which makes Cr the material of choice for
                      capping Co2FeSi films. We report stronger XMLD intensities
                      at the L3,2L3,2 Co and Fe egdes for films with a higher
                      saturation magnetization. Additionally, we compare the
                      spectra with ab initio predictions and obtain a reasonably
                      good agreement. Furthermore, we were able to detect an XMCD
                      signal at the Si L-edge, indicating the presence of a
                      magnetic moment at the Si atoms.},
      cin          = {PGI-6},
      ddc          = {530},
      cid          = {I:(DE-Juel1)PGI-6-20110106},
      pnm          = {422 - Spin-based and quantum information (POF2-422)},
      pid          = {G:(DE-HGF)POF2-422},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000340049600057},
      doi          = {10.1016/j.jmmm.2014.06.001},
      url          = {https://juser.fz-juelich.de/record/201871},
}