% IMPORTANT: The following is UTF-8 encoded.  This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.

@ARTICLE{Houben:20311,
      author       = {Houben, L. and Heidelmann, M. and Gunkel, F.},
      title        = {{S}patial resolution and radiation damage in quantitative
                      high-resolution {STEM}-{EEL} spectroscopy in oxides},
      journal      = {Micron},
      volume       = {43},
      issn         = {0968-4328},
      address      = {New York, NY [u.a.]},
      publisher    = {Elsevier},
      reportid     = {PreJuSER-20311},
      pages        = {532 - 537},
      year         = {2012},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {The chemical analysis on the atomic scale in a scanning
                      transmission electron microscope bears a number of
                      challenges. These are an unambiguous assignment of a
                      spectroscopic signal to a sample location and sufficient
                      signal above noise for quantification. Modern
                      aberration-corrected optics provide intense electron probes
                      allowing for the highest spatial resolution and beam current
                      density possible. On the other hand, non-destructive
                      analysis requires low irradiation doses, so that there is a
                      limit to the achievable signal-to-noise ratio. Here, we
                      employ the StripeSTEM method that sacrifices the resolution
                      in one spatial dimension in return for decreased radiation
                      damage to the sample. Using this technique, radiation damage
                      effects and achievable quantification accuracy are examined
                      on the example of bulk SrTiO3 and a one unit cell thick
                      layer of LaAlO3 in SrTiO3. The results show that valency
                      artefacts are expected for conventional recording conditions
                      where the electron dose is concentrated to a few atomic
                      columns. Likewise a high accuracy for measuring the oxygen
                      defect chemistry without radiation damage requires spreading
                      out the irradiation dose. (C) 2011 Elsevier Ltd. All rights
                      reserved.},
      keywords     = {J (WoSType)},
      cin          = {PGI-7 / JARA-FIT / PGI-6},
      ddc          = {570},
      cid          = {I:(DE-Juel1)PGI-7-20110106 / $I:(DE-82)080009_20140620$ /
                      I:(DE-Juel1)PGI-6-20110106},
      pnm          = {Grundlagen für zukünftige Informationstechnologien},
      pid          = {G:(DE-Juel1)FUEK412},
      shelfmark    = {Microscopy},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000301702400006},
      doi          = {10.1016/j.micron.2011.10.006},
      url          = {https://juser.fz-juelich.de/record/20311},
}