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001 | 203136 | ||
005 | 20210129220305.0 | ||
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100 | 1 | _ | |a Demarina, Nataliya |0 P:(DE-Juel1)125576 |b 0 |e Corresponding author |u fzj |
245 | _ | _ | |a Electrical properties of rolled-up p-type Si/SiGe heterostructures |
260 | _ | _ | |a Melville, NY |c 2011 |b American Inst. of Physics |
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520 | _ | _ | |a We report a theoretical study of the hole density and the low-field mobility in modulation p-doped rolled-up Si/SiGe heterostructures. Solving coupled Poisson and Schrödinger equations, we show that the total hole density is strongly affected by charged surface states and can reach value of 1011 cm−2 for available doping level at room and low temperature. The simulation of the hole transport along the structure axis based on a Monte Carlo method reveals that the interface roughness scattering is a main mechanism limiting the mobility magnitude, which reaches the value of 104 cm2/V s. |
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773 | _ | _ | |a 10.1063/1.3584869 |g Vol. 98, no. 19, p. 192109 - |0 PERI:(DE-600)1469436-0 |n 19 |p 192109 - |t Applied physics letters |v 98 |y 2011 |x 0003-6951 |
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