% IMPORTANT: The following is UTF-8 encoded.  This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.

@ARTICLE{Andr:203200,
      author       = {Andrä, Michael and Gunkel, Felix and Bäumer, Christoph
                      and Xu, Chencheng and Dittmann, Regina and Waser, Rainer},
      title        = {{T}he influence of the local oxygen vacancy concentration
                      on the piezoresponse of strontium titanate thin films},
      journal      = {Nanoscale},
      volume       = {7},
      number       = {34},
      issn         = {2040-3372},
      address      = {Cambridge},
      publisher    = {RSC Publ.},
      reportid     = {FZJ-2015-05198},
      pages        = {14351-14357},
      year         = {2015},
      abstract     = {n this study, the influence of the local oxygen vacancy
                      concentration on piezoresponse force microscopy (PFM)
                      measurements was investigated. Ultra-thin single-crystalline
                      SrTiO3 thin films were deposited on niobium doped SrTiO3
                      substrates and analyzed using a combined PFM and local
                      conductive atomic force microscopy (LC-AFM) measurement
                      setup. After applying different polarization voltages
                      between ±2 V and ±5 V to the thin films, we simultaneously
                      observed an anomalous contrast in the piezoresponse
                      amplitude and phase signal as well as a changed local
                      conductivity in the exact same region. Since classic
                      ferroelectricity can be excluded as the reason for the
                      observed contrast, an influence of the local oxygen vacancy
                      concentration on the piezoresponse is considered.
                      Additionally, the surface potential was measured using
                      Kelvin probe force microscopy (KPFM) revealing a change in
                      surface potential in the regions of the applied voltage. The
                      observed relaxation of the surface potential over time was
                      fitted to a local oxidation reaction of the previously
                      reduced regions of the ultra-thin SrTiO3 film. We propose a
                      model that relates the local oxygen vacancy concentration to
                      the surface potential. The influence of the oxygen vacancy
                      concentration on the PFM measurements is explained.},
      cin          = {PGI-7},
      ddc          = {600},
      cid          = {I:(DE-Juel1)PGI-7-20110106},
      pnm          = {524 - Controlling Collective States (POF3-524)},
      pid          = {G:(DE-HGF)POF3-524},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000360117200020},
      doi          = {10.1039/C5NR03643G},
      url          = {https://juser.fz-juelich.de/record/203200},
}