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@INPROCEEDINGS{Dellen:203309,
      author       = {Dellen, Christian and Lobe, Sandra and Möller, Sören and
                      Breuer, Uwe and Finsterbusch, Martin and Uhlenbruck, Sven
                      and Guillon, Olivier and Bram, Martin},
      title        = {{L}ithium distribution as function of state of charge in
                      thin film all solid state batteries characterized by time of
                      flight secondary ion mass spectrometry},
      reportid     = {FZJ-2015-05276},
      year         = {2015},
      abstract     = {Time of flight secondary ion mass spectrometry (ToF-SIMS)
                      is an appropriate analytical technique for the investigation
                      of thin film Li ion battery components, especially when the
                      depth and spatial distribution of lithium inside a battery
                      component or even the whole thin film cell are of interest.
                      Analytical techniques using electron or x-ray beams for
                      elemental detection are not able to access lithium in a
                      sufficient way due to its low atomic number of Z=3. The low
                      detection limits of ToF-SIMS and its eminent spatial
                      resolution make this technique a suitable candidate to
                      investigate the interface between different functional
                      battery layers or to visualize the lithium distribution
                      within e.g. the active cathode layer. Therefore, a layered
                      structure of a thin film all solid state battery system with
                      a typical thickness of a few micrometers is an ideal model
                      system for a detailed ToF-SIMS study. While operating in the
                      dual beam mode, the ToF-SIMS is able to investigate all
                      electrochemical active layers of the battery in one depth
                      profile.The starting point of this study is the
                      investigation of thin films of the commonly used cathode
                      material LiCoO2. The thin film cathodes are prepared by a
                      radio frequency sputter deposition process. The first aspect
                      is the investigation of the deposition process by ToF-SIMS
                      and by other analytical methods like e.g. scanning electron
                      microscopy or x-ray diffraction. Using these techniques, the
                      impact of different deposition parameters like e.g. the
                      deposition temperature or the effect of an additional
                      interlayer as diffusion barrier and adhesion layer is
                      investigated. This knowledge is applied to enable the
                      reproducible production of samples. The key aspect of this
                      study is monitoring the lithiation and delithiation process
                      of the LiCoO2 cathode material using post mortem ToF-SIMS
                      analysis. Therefore, different thin film batteries with
                      LiCoO2 cathodes in combination with liquid electrolytes and
                      also solid state electrolytes are cycled to different states
                      of charge. Afterwards elemental distributions (especially
                      Li) within the cathode are measured by ToF-SIMS and the
                      different states of charge (SOC) are compared in a semi
                      quantitative way. It is discussed, how the deintercalation
                      of lithium during charging affects the matrix environment
                      and hence the characteristics of the depth profiles. In
                      order to get also a quantitative insight into the Li
                      distribution within the thin films, 2 MeV p nuclear reaction
                      analysis and glow discharge optical emission spectroscopy
                      are used as quantitative comparison methods.},
      month         = {Sep},
      date          = {2015-09-13},
      organization  = {20th International Conference on
                       Secondary Ion Mass Spectrometry,
                       Seattle (USA), 13 Sep 2015 - 18 Sep
                       2015},
      cin          = {IEK-1 / IEK-4 / ZEA-3},
      cid          = {I:(DE-Juel1)IEK-1-20101013 / I:(DE-Juel1)IEK-4-20101013 /
                      I:(DE-Juel1)ZEA-3-20090406},
      pnm          = {131 - Electrochemical Storage (POF3-131) / HITEC -
                      Helmholtz Interdisciplinary Doctoral Training in Energy and
                      Climate Research (HITEC) (HITEC-20170406)},
      pid          = {G:(DE-HGF)POF3-131 / G:(DE-Juel1)HITEC-20170406},
      typ          = {PUB:(DE-HGF)1},
      url          = {https://juser.fz-juelich.de/record/203309},
}