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@INPROCEEDINGS{Schmelzer:21900,
      author       = {Schmelzer, S. and Böttger, U. and Waser, R.},
      title        = {{I}nvestigation of interfacial passive layers in
                      {S}r{T}i{O}3 ultra thin film capacitors on silicon
                      substrates},
      reportid     = {PreJuSER-21900},
      year         = {2012},
      note         = {Record converted from VDB: 12.11.2012},
      comment      = {Materials Research Society Spring Meeting},
      booktitle     = {Materials Research Society Spring
                       Meeting},
      month         = {Apr},
      date          = {2012-04-24},
      organization  = {San Francisco, USA, 24 Apr 2012},
      cin          = {JARA-FIT / PGI-7},
      cid          = {$I:(DE-82)080009_20140620$ / I:(DE-Juel1)PGI-7-20110106},
      pnm          = {Grundlagen für zukünftige Informationstechnologien},
      pid          = {G:(DE-Juel1)FUEK412},
      typ          = {PUB:(DE-HGF)6},
      url          = {https://juser.fz-juelich.de/record/21900},
}