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@INPROCEEDINGS{Kim:21903,
      author       = {Kim, J.H. and Reiners, M. and Hoffmann-Eifert, S. and
                      Waser, R.},
      title        = {{I}nfluence of different metal electrodes on resistive
                      switching behavior of atomic-layer deposited {T}a2{O}5
                      films},
      reportid     = {PreJuSER-21903},
      year         = {2012},
      note         = {Record converted from VDB: 12.11.2012},
      comment      = {European Materials Research Society (E-MRS) 2012 Spring
                      Meeting},
      booktitle     = {European Materials Research Society
                       (E-MRS) 2012 Spring Meeting},
      month         = {May},
      date          = {2012-05-14},
      organization  = {Strasbourg, France, 14 May 2012},
      cin          = {JARA-FIT / PGI-7},
      cid          = {$I:(DE-82)080009_20140620$ / I:(DE-Juel1)PGI-7-20110106},
      pnm          = {Grundlagen für zukünftige Informationstechnologien},
      pid          = {G:(DE-Juel1)FUEK412},
      typ          = {PUB:(DE-HGF)6},
      url          = {https://juser.fz-juelich.de/record/21903},
}