%0 Journal Article
%A Wiemann, C.
%A Patt, M.
%A Cramm, S.
%A Escher, M.
%A Merkel, M.
%A Gloskovskii, A.
%A Thiess, S.
%A Drube, W.
%A Schneider, C. M.
%T Probing buried layers by photoelectron spectromicroscopy with hard x-ray excitation
%J Applied physics / A
%V 100
%@ 0947-8396
%C Berlin
%I Springer
%M PreJuSER-22014
%P 223106
%D 2012
%Z Thanks are due to Ch. Lenser for providing the STO sample. Financial support through the Deutsche Forschungsgemeinschaft within Sonderforschungsbereich 917 "Nanoswitches" is gratefully acknowledged.
%X We report about a proof-of-principle experiment which explores the perspectives of performing hard x-ray photoemission spectromicroscopy with high lateral resolution. Our results obtained with an energy-filtered photoemission microscope at the PETRA III storage ring facility using hard x-ray excitation up to 6.5 keV photon energy demonstrate that it is possible to obtain selected-area x-ray photoemission spectra from regions less than 500 nm in diameter. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4722940]
%K J (WoSType)
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000304823800049
%R 10.1063/1.4722940
%U https://juser.fz-juelich.de/record/22014