Hauptseite > Publikationsdatenbank > Probing buried layers by photoelectron spectromicroscopy with hard x-ray excitation > print

001     22014
005     20180210125942.0
024 7 _ |2 DOI
|a 10.1063/1.4722940
024 7 _ |2 WOS
|a WOS:000304823800049
024 7 _ |2 ISSN
|a 0947-8396
037 _ _ |a PreJuSER-22014
041 _ _ |a eng
082 _ _ |a 530
084 _ _ |2 WoS
|a Physics, Applied
100 1 _ |0 P:(DE-Juel1)VDB72090
|a Wiemann, C.
|b 0
|u FZJ
245 _ _ |a Probing buried layers by photoelectron spectromicroscopy with hard x-ray excitation
260 _ _ |a Berlin
|b Springer
|c 2012
300 _ _ |a 223106
336 7 _ |a Journal Article
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440 _ 0 |0 560
|a Applied Physics A
|v 100
|x 0947-8396
|y 22
500 _ _ |3 POF3_Assignment on 2016-02-29
500 _ _ |a Thanks are due to Ch. Lenser for providing the STO sample. Financial support through the Deutsche Forschungsgemeinschaft within Sonderforschungsbereich 917 "Nanoswitches" is gratefully acknowledged.
520 _ _ |a We report about a proof-of-principle experiment which explores the perspectives of performing hard x-ray photoemission spectromicroscopy with high lateral resolution. Our results obtained with an energy-filtered photoemission microscope at the PETRA III storage ring facility using hard x-ray excitation up to 6.5 keV photon energy demonstrate that it is possible to obtain selected-area x-ray photoemission spectra from regions less than 500 nm in diameter. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4722940]
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700 1 _ |0 P:(DE-Juel1)VDB56605
|a Patt, M.
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700 1 _ |0 P:(DE-Juel1)130601
|a Cramm, S.
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|a Escher, M.
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|a Merkel, M.
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|a Gloskovskii, A.
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700 1 _ |0 P:(DE-HGF)0
|a Thiess, S.
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700 1 _ |0 P:(DE-HGF)0
|a Drube, W.
|b 7
700 1 _ |0 P:(DE-Juel1)130948
|a Schneider, C. M.
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773 _ _ |0 PERI:(DE-600)1398311-8
|a 10.1063/1.4722940
|g Vol. 100, p. 223106
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|t Applied physics / A
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856 7 _ |u http://dx.doi.org/10.1063/1.4722940
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