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001     22014
005     20180210125942.0
024 7 _ |2 DOI
|a 10.1063/1.4722940
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024 7 _ |2 ISSN
|a 0947-8396
037 _ _ |a PreJuSER-22014
041 _ _ |a eng
082 _ _ |a 530
084 _ _ |2 WoS
|a Physics, Applied
100 1 _ |0 P:(DE-Juel1)VDB72090
|a Wiemann, C.
|b 0
|u FZJ
245 _ _ |a Probing buried layers by photoelectron spectromicroscopy with hard x-ray excitation
260 _ _ |a Berlin
|b Springer
|c 2012
300 _ _ |a 223106
336 7 _ |a Journal Article
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440 _ 0 |0 560
|a Applied Physics A
|v 100
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|y 22
500 _ _ |3 POF3_Assignment on 2016-02-29
500 _ _ |a Thanks are due to Ch. Lenser for providing the STO sample. Financial support through the Deutsche Forschungsgemeinschaft within Sonderforschungsbereich 917 "Nanoswitches" is gratefully acknowledged.
520 _ _ |a We report about a proof-of-principle experiment which explores the perspectives of performing hard x-ray photoemission spectromicroscopy with high lateral resolution. Our results obtained with an energy-filtered photoemission microscope at the PETRA III storage ring facility using hard x-ray excitation up to 6.5 keV photon energy demonstrate that it is possible to obtain selected-area x-ray photoemission spectra from regions less than 500 nm in diameter. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4722940]
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|a Patt, M.
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|a Cramm, S.
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|a Gloskovskii, A.
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|a Thiess, S.
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|a Drube, W.
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|a Schneider, C. M.
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856 7 _ |u http://dx.doi.org/10.1063/1.4722940
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