TY  - CONF
AU  - Aslam, N.
AU  - Blanquart, T.
AU  - Mähne, H.
TI  - Comparison of the resistive switching behavior in Nb2O5 thin films grown by atomic layer deposition and sputtering
M1  - PreJuSER-23354
PY  - 2012
N1  - Record converted from VDB: 16.11.2012
Y2  - 9 Jan 2012
M2  - Helsinki, Finland, 
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/23354
ER  -