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@ARTICLE{Nagy:25149,
author = {Nagy, G. M. and Kerner, Z. and Pajkossy, T.},
title = {{I}n situ electrochemical impedance spectroscopy of
${Z}r-1\%{N}b$ under {VVER} primary circuit conditions},
journal = {Journal of nuclear materials},
volume = {300},
issn = {0022-3115},
address = {Amsterdam [u.a.]},
publisher = {Elsevier Science},
reportid = {PreJuSER-25149},
pages = {230},
year = {2002},
note = {Record converted from VDB: 12.11.2012},
abstract = {Oxide layers were grown on tubular samples of $Zr-l\%Nb$
under conditions simulating those in VVER-type pressurised
water reactors. viz. in near-neutral borate solutions in an
autoclave at 290 degreesC. These samples were investigated
using electrochemical impedance spectroscopy which was found
to be suitable to follow in situ the corrosion process. A
-CPE(ox)parallel toR(ox)- element was used to characterise
the oxide layer on $Zr-l\%Nb.$ Both the CPEox coefficient,
sigma(ox), and the parallel resistance, Ro(x), were found to
be thickness dependent. The layer thickness, however. can
only be calculated after a calibration procedure. The
temperature dependence of the CPEox element was also found
to be anomalous while the temperature dependence of R.,
indicates that the oxide layer has semiconductor properties.
The relaxation time defined as (R(ox)sigma(ox))(1/x) was
found to be quasi-independent of oxidation time and
temperature; thus it is characteristic to the oxide layer on
$Zr-l\%Nb.$ (C) 2002 Elsevier Science B.V. All rights
reserved.},
keywords = {J (WoSType)},
cin = {ISG-3},
ddc = {530},
cid = {I:(DE-Juel1)VDB43},
pnm = {Kondensierte Materie},
pid = {G:(DE-Juel1)FUEK242},
shelfmark = {Materials Science, Multidisciplinary / Nuclear Science $\&$
Technology / Mining $\&$ Mineral Processing},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000173903300011},
doi = {10.1016/S0022-3115(01)00735-8},
url = {https://juser.fz-juelich.de/record/25149},
}