001     25959
005     20180210142201.0
024 7 _ |2 DOI
|a 10.1016/S0924-4247(01)00850-0
024 7 _ |2 WOS
|a WOS:000176297000093
037 _ _ |a PreJuSER-25959
041 _ _ |a eng
082 _ _ |a 530
084 _ _ |2 WoS
|a Engineering, Electrical & Electronic
084 _ _ |2 WoS
|a Instruments & Instrumentation
100 1 _ |a Kueppers, H.
|b 0
|0 P:(DE-HGF)0
245 _ _ |a PZT thin films for piezoelectric microactuator applications
260 _ _ |a Amsterdam [u.a.]
|b Elsevier Science
|c 2002
300 _ _ |a 680 - 684
336 7 _ |a Journal Article
|0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
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|2 EndNote
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a article
|2 DRIVER
440 _ 0 |a Sensors and Actuators A
|x 0924-4247
|0 5501
|v 97-98
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a The objective of these investigations was the development of a technology for the integration of piezoelectric PZT thin film.,; deposited by chemical solution deposition (CSD) on silicon-based cantilevers for micromirror and microrelay applications. The fabrication process is presented in detail with attention to the PZT thin film. The electrical properties of these thin films have been studied with hysteresis, capacitance-voltage (C-V) and current density-electric field (S-E) measurements. Furthermore, laser interferometry investigations on completed microactuators are depicted. For 390 mum long cantilever structures tip deflections up to 20 mum at an applied voltage of 10 V were measured. The piezoelectric coefficient d(31) was measured to be -12 pC/N. Resonance frequency measurements on a 190 mum long cantilever resulted in a value of 23 kHz. (C) 2002 Elsevier Science B.V. All rights reserved.
536 _ _ |a Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
|c I01
|2 G:(DE-HGF)
|0 G:(DE-Juel1)FUEK252
|x 0
588 _ _ |a Dataset connected to Web of Science
650 _ 7 |a J
|2 WoSType
653 2 0 |2 Author
|a PZT
653 2 0 |2 Author
|a microactuator
653 2 0 |2 Author
|a CSD
653 2 0 |2 Author
|a piezoelectric coefficient d(31)
700 1 _ |a Leuerer, T.
|b 1
|0 P:(DE-HGF)0
700 1 _ |a Schnakenberg, U.
|b 2
|0 P:(DE-HGF)0
700 1 _ |a Mokwa, W.
|b 3
|0 P:(DE-HGF)0
700 1 _ |a Hoffmann, M.
|b 4
|0 P:(DE-HGF)0
700 1 _ |a Schneller, T.
|b 5
|0 P:(DE-HGF)0
700 1 _ |a Boettger, U.
|b 6
|0 P:(DE-HGF)0
700 1 _ |a Waser, R.
|b 7
|u FZJ
|0 P:(DE-Juel1)131022
773 _ _ |a 10.1016/S0924-4247(01)00850-0
|g Vol. 97-98, p. 680 - 684
|p 680 - 684
|q 97-98<680 - 684
|0 PERI:(DE-600)1500729-7
|t Sensors and actuators / A
|v 97-98
|y 2002
|x 0924-4247
909 C O |o oai:juser.fz-juelich.de:25959
|p VDB
913 1 _ |k I01
|v Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
|l Informationstechnologie mit nanoelektronischen Systemen
|b Information
|0 G:(DE-Juel1)FUEK252
|x 0
914 1 _ |y 2002
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
920 1 _ |k IFF-EKM
|l Elektrokeramische Materialien
|d 31.12.2003
|g IFF
|0 I:(DE-Juel1)VDB35
|x 0
970 _ _ |a VDB:(DE-Juel1)17356
980 _ _ |a VDB
980 _ _ |a ConvertedRecord
980 _ _ |a journal
980 _ _ |a I:(DE-Juel1)PGI-7-20110106
980 _ _ |a UNRESTRICTED
981 _ _ |a I:(DE-Juel1)PGI-7-20110106


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