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@ARTICLE{Hoffmann:25960,
      author       = {Hoffmann, M. and Hofer, C. and Schneller, T. and Böttger,
                      U. and Waser, R.},
      title        = {{P}reparation and ageing behavior of
                      chemical-solution-deposited
                      ({P}b{M}g(0.33){N}b(0,67){O}3)1-x-({P}b{T}i{O}3)x thin films
                      without seeding layers},
      journal      = {Journal of the American Ceramic Society},
      volume       = {85},
      issn         = {0002-7820},
      address      = {Oxford [u.a.]},
      publisher    = {Wiley-Blackwell},
      reportid     = {PreJuSER-25960},
      pages        = {1867 - 1869},
      year         = {2002},
      note         = {Record converted from VDB: 12.11.2012},
      cin          = {IFF-EKM},
      ddc          = {660},
      cid          = {I:(DE-Juel1)VDB35},
      pnm          = {Materialien, Prozesse und Bauelemente für die Mikro- und
                      Nanoelektronik},
      pid          = {G:(DE-Juel1)FUEK252},
      typ          = {PUB:(DE-HGF)16},
      url          = {https://juser.fz-juelich.de/record/25960},
}