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000002731 0247_ $$2DOI$$a10.1007/s10971-008-1816-y
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000002731 084__ $$2WoS$$aMaterials Science, Ceramics
000002731 1001_ $$0P:(DE-Juel1)VDB3028$$aSchneller, T.$$b0$$uFZJ
000002731 245__ $$aInvestigation of the amorphous to crystalline phase transition of chemical solution deposited Pb(Zr0.3Ti0.7)O3 thin films by soft X-ray absorption and soft X-ray emission spectroscopy
000002731 260__ $$aDordrecht [u.a.]$$bSpringer Science + Business Media B.V$$c2008
000002731 300__ $$a239 - 252
000002731 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article
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000002731 440_0 $$014361$$aJournal of Sol-Gel Science and Technology$$v48$$x0928-0707
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000002731 520__ $$aChemical solution deposited (CSD) complex oxide thin films attract considerable interest in various emerging fields as for example, fuel cells, ferroelectric random access memories or coated conductors. In the present paper the results of soft-X-ray spectroscopy between 280 and 560 eV on the amorphous to crystalline phase transition of ferroelectric Pb(Zr0.3Ti0.7)O-3 (PZT) thin films are presented. Five CSD samples derived from the same wafer coated with a PZT film pyrolyzed at 350 degrees C were heat treated at different temperatures between 400 and 700 degrees C. At first the samples were morphologically and electrically characterized. Subsequently the soft-X-ray absorption and emission experiments were performed at the undulator beamline 8.0 of the Advanced Light Source of the Lawrence Berkeley National Laboratory. Soft-X-ray absorption spectra were acquired for the Ti L (2,3)-, O K-, and C K-edge thresholds by using simultaneously the total electron yield (TEY) and total fluorescence yield (TFY) detection methods. For two samples, annealed at 400 and 700 degrees C, respectively, the resonant inelastic soft-X-ray spectroscopy (RIXS) was applied for various excitation energies near the Ti L-, O K-edges. We observed clear evidence of a rutile phase at untypically low temperatures. This rutile phase transforms into the perovskite phase upon increasing annealing temperature. These results are discussed in the framework of current microscopic models of the PZT (111) texture selection.
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000002731 650_7 $$2WoSType$$aJ
000002731 65320 $$2Author$$achemical solution deposition
000002731 65320 $$2Author$$acomplex oxide films
000002731 65320 $$2Author$$aferroelectric
000002731 65320 $$2Author$$aPZT
000002731 65320 $$2Author$$athin films
000002731 65320 $$2Author$$aXRD
000002731 65320 $$2Author$$aXAS
000002731 65320 $$2Author$$aRIXS
000002731 65320 $$2Author$$amicrostructure
000002731 65320 $$2Author$$ahysteresis
000002731 7001_ $$0P:(DE-Juel1)VDB3107$$aKohlstedt, H.$$b1$$uFZJ
000002731 7001_ $$0P:(DE-Juel1)VDB5557$$aPetraru, A.$$b2$$uFZJ
000002731 773__ $$0PERI:(DE-600)1472726-2$$a10.1007/s10971-008-1816-y$$gVol. 48, p. 239 - 252$$p239 - 252$$q48<239 - 252$$tJournal of sol gel science and technology$$v48$$x0928-0707$$y2008
000002731 8567_ $$uhttp://dx.doi.org/10.1007/s10971-008-1816-y
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000002731 9141_ $$y2008
000002731 915__ $$0StatID:(DE-HGF)0010$$aJCR/ISI refereed
000002731 9201_ $$0I:(DE-Juel1)VDB786$$d31.12.2010$$gIFF$$kIFF-6$$lElektronische Materialien$$x0
000002731 9201_ $$0I:(DE-82)080009_20140620$$gJARA$$kJARA-FIT$$lJülich-Aachen Research Alliance - Fundamentals of Future Information Technology$$x1
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