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@ARTICLE{Schneller:2731,
      author       = {Schneller, T. and Kohlstedt, H. and Petraru, A.},
      title        = {{I}nvestigation of the amorphous to crystalline phase
                      transition of chemical solution deposited
                      {P}b({Z}r0.3{T}i0.7){O}3 thin films by soft {X}-ray
                      absorption and soft {X}-ray emission spectroscopy},
      journal      = {Journal of sol gel science and technology},
      volume       = {48},
      issn         = {0928-0707},
      address      = {Dordrecht [u.a.]},
      publisher    = {Springer Science + Business Media B.V},
      reportid     = {PreJuSER-2731},
      pages        = {239 - 252},
      year         = {2008},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {Chemical solution deposited (CSD) complex oxide thin films
                      attract considerable interest in various emerging fields as
                      for example, fuel cells, ferroelectric random access
                      memories or coated conductors. In the present paper the
                      results of soft-X-ray spectroscopy between 280 and 560 eV on
                      the amorphous to crystalline phase transition of
                      ferroelectric Pb(Zr0.3Ti0.7)O-3 (PZT) thin films are
                      presented. Five CSD samples derived from the same wafer
                      coated with a PZT film pyrolyzed at 350 degrees C were heat
                      treated at different temperatures between 400 and 700
                      degrees C. At first the samples were morphologically and
                      electrically characterized. Subsequently the soft-X-ray
                      absorption and emission experiments were performed at the
                      undulator beamline 8.0 of the Advanced Light Source of the
                      Lawrence Berkeley National Laboratory. Soft-X-ray absorption
                      spectra were acquired for the Ti L (2,3)-, O K-, and C
                      K-edge thresholds by using simultaneously the total electron
                      yield (TEY) and total fluorescence yield (TFY) detection
                      methods. For two samples, annealed at 400 and 700 degrees C,
                      respectively, the resonant inelastic soft-X-ray spectroscopy
                      (RIXS) was applied for various excitation energies near the
                      Ti L-, O K-edges. We observed clear evidence of a rutile
                      phase at untypically low temperatures. This rutile phase
                      transforms into the perovskite phase upon increasing
                      annealing temperature. These results are discussed in the
                      framework of current microscopic models of the PZT (111)
                      texture selection.},
      keywords     = {J (WoSType)},
      cin          = {IFF-6 / JARA-FIT},
      ddc          = {600},
      cid          = {I:(DE-Juel1)VDB786 / $I:(DE-82)080009_20140620$},
      pnm          = {Grundlagen für zukünftige Informationstechnologien},
      pid          = {G:(DE-Juel1)FUEK412},
      shelfmark    = {Materials Science, Ceramics},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000259273400034},
      doi          = {10.1007/s10971-008-1816-y},
      url          = {https://juser.fz-juelich.de/record/2731},
}