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@ARTICLE{Tsuruoka:279247,
      author       = {Tsuruoka, Tohru and Valov, Ilia and Tappertzhofen, Stefan
                      and van den Hurk, Jan and Hasegawa, Tsuyoshi and Waser, R.
                      and Aono, Masakazu},
      title        = {{R}edox {R}eactions at {C}u,{A}g/{T}a $_{2}$ {O} $_{5}$
                      {I}nterfaces and the {E}ffects of {T}a $_{2}$ {O} $_{5}$
                      {F}ilm {D}ensity on the {F}orming {P}rocess in {A}tomic
                      {S}witch {S}tructures},
      journal      = {Advanced functional materials},
      volume       = {25},
      number       = {40},
      issn         = {1616-301X},
      address      = {Weinheim},
      publisher    = {Wiley-VCH},
      reportid     = {FZJ-2015-07262},
      pages        = {6374 - 6381},
      year         = {2015},
      abstract     = {Cu and Ag redox reactions at the interfaces with Ta2O5 and
                      the impact of Ta2O5 film density on the forming process of
                      Cu,Ag/Ta2O5/Pt atomic switch structures are investigated.
                      Cyclic voltammetry measurements revealed that under positive
                      bias to the Cu (Ag) electrode, Cu is preferentially oxidized
                      to Cu2+, while Ag is oxidized to Ag+ ions. Subsequent
                      negative bias causes a reduction of oxidized Cu (Ag) ions at
                      the interfaces. The diffusion coefficient of the Cu and Ag
                      ions in the Ta2O5 film is estimated from the results from
                      different bias voltage sweep rates. It is also found that
                      the redox current is enhanced and the forming voltage of the
                      Cu/Ta2O5/Pt cell is reduced when the density of the Ta2O5
                      film is decreased. This result indicates the importance of
                      the structural properties of the matrix oxide film in
                      understanding and controlling resistive switching behavior},
      cin          = {PGI-7},
      ddc          = {620},
      cid          = {I:(DE-Juel1)PGI-7-20110106},
      pnm          = {521 - Controlling Electron Charge-Based Phenomena
                      (POF3-521)},
      pid          = {G:(DE-HGF)POF3-521},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000363685900008},
      doi          = {10.1002/adfm.201500853},
      url          = {https://juser.fz-juelich.de/record/279247},
}