Hauptseite > Publikationsdatenbank > Avalanche-Discharge-Induced Electrical Forming in Tantalum Oxide-Based Metal-Insulator-Metal Structures > print |
001 | 279651 | ||
005 | 20240610120618.0 | ||
024 | 7 | _ | |a 10.1002/adfm.201502767 |2 doi |
024 | 7 | _ | |a 1057-9257 |2 ISSN |
024 | 7 | _ | |a 1099-0712 |2 ISSN |
024 | 7 | _ | |a 1616-301X |2 ISSN |
024 | 7 | _ | |a 1616-3028 |2 ISSN |
024 | 7 | _ | |a WOS:000366503700005 |2 WOS |
037 | _ | _ | |a FZJ-2015-07533 |
082 | _ | _ | |a 620 |
100 | 1 | _ | |a Skaja, Katharina |0 P:(DE-Juel1)145428 |b 0 |
245 | _ | _ | |a Avalanche-Discharge-Induced Electrical Forming in Tantalum Oxide-Based Metal-Insulator-Metal Structures |
260 | _ | _ | |a Weinheim |c 2015 |b Wiley-VCH |
336 | 7 | _ | |a Journal Article |b journal |m journal |0 PUB:(DE-HGF)16 |s 1450085724_20500 |2 PUB:(DE-HGF) |
336 | 7 | _ | |a Output Types/Journal article |2 DataCite |
336 | 7 | _ | |a Journal Article |0 0 |2 EndNote |
336 | 7 | _ | |a ARTICLE |2 BibTeX |
336 | 7 | _ | |a JOURNAL_ARTICLE |2 ORCID |
336 | 7 | _ | |a article |2 DRIVER |
520 | _ | _ | |a Oxide-based metal–insulator–metal structures are of special interest for future resistive random-access memories. In such cells, redox processes on the nanoscale occur during resistive switching, which are initiated by the reversible movement of native donors, such as oxygen vacancies. The formation of these filaments is mainly attributed to an enhanced oxygen diffusion due to Joule heating in an electric field or due to electrical breakdown. Here, the development of a dendrite-like structure, which is induced by an avalanche discharge between the top electrode and the Ta2O5-x layer, is presented, which occurs instead of a local breakdown between top and bottom electrode. The dendrite-like structure evolves primarily at structures with a pronounced interface adsorbate layer. Furthermore, local conductive atomic force microscopy reveals that the entire dendrite region becomes conductive. Via spectromicroscopy it is demonstrated that the subsequent switching is caused by a valence change between Ta4+ and Ta5+, which takes place over the entire former Pt/Ta2O5-x interface of the dendrite-like structure. |
536 | _ | _ | |a 521 - Controlling Electron Charge-Based Phenomena (POF3-521) |0 G:(DE-HGF)POF3-521 |c POF3-521 |f POF III |x 0 |
588 | _ | _ | |a Dataset connected to CrossRef |
700 | 1 | _ | |a Bäumer, Christoph |0 P:(DE-Juel1)159254 |b 1 |
700 | 1 | _ | |a Peters, Oliver |0 P:(DE-Juel1)161184 |b 2 |
700 | 1 | _ | |a Menzel, Stephan |0 P:(DE-Juel1)158062 |b 3 |
700 | 1 | _ | |a Moors, Marco |0 P:(DE-Juel1)145323 |b 4 |
700 | 1 | _ | |a Du, Hongchu |0 P:(DE-Juel1)145710 |b 5 |
700 | 1 | _ | |a Bornhöfft, Manuel |0 P:(DE-Juel1)159411 |b 6 |
700 | 1 | _ | |a Schmitz, Christoph |0 P:(DE-Juel1)159492 |b 7 |
700 | 1 | _ | |a Feyer, Vitaliy |0 P:(DE-Juel1)145012 |b 8 |
700 | 1 | _ | |a Jia, Chun-Lin |0 P:(DE-Juel1)130736 |b 9 |
700 | 1 | _ | |a Schneider, Claus Michael |0 P:(DE-Juel1)130948 |b 10 |
700 | 1 | _ | |a Mayer, Joachim |0 P:(DE-Juel1)130824 |b 11 |
700 | 1 | _ | |a Waser, Rainer |0 P:(DE-HGF)0 |b 12 |
700 | 1 | _ | |a Dittmann, Regina |0 P:(DE-Juel1)130620 |b 13 |e Corresponding author |
773 | _ | _ | |a 10.1002/adfm.201502767 |g p. n/a - n/a |0 PERI:(DE-600)2039420-2 |n 46 |p 7154–7162 |t Advanced functional materials |v 25 |y 2015 |x 1616-301X |
909 | C | O | |o oai:juser.fz-juelich.de:279651 |p VDB |p OpenAPC |p openCost |
910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 0 |6 P:(DE-Juel1)145428 |
910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 1 |6 P:(DE-Juel1)159254 |
910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 3 |6 P:(DE-Juel1)158062 |
910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 4 |6 P:(DE-Juel1)145323 |
910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 5 |6 P:(DE-Juel1)145710 |
910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 6 |6 P:(DE-Juel1)159411 |
910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 7 |6 P:(DE-Juel1)159492 |
910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 8 |6 P:(DE-Juel1)145012 |
910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 9 |6 P:(DE-Juel1)130736 |
910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 10 |6 P:(DE-Juel1)130948 |
910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 11 |6 P:(DE-Juel1)130824 |
910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 12 |6 P:(DE-HGF)0 |
910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 13 |6 P:(DE-Juel1)130620 |
913 | 1 | _ | |a DE-HGF |b Key Technologies |l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT) |1 G:(DE-HGF)POF3-520 |0 G:(DE-HGF)POF3-521 |2 G:(DE-HGF)POF3-500 |v Controlling Electron Charge-Based Phenomena |x 0 |4 G:(DE-HGF)POF |3 G:(DE-HGF)POF3 |
914 | 1 | _ | |y 2015 |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0200 |2 StatID |b SCOPUS |
915 | _ | _ | |a JCR |0 StatID:(DE-HGF)0100 |2 StatID |b ADV FUNCT MATER : 2014 |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0300 |2 StatID |b Medline |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0310 |2 StatID |b NCBI Molecular Biology Database |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0199 |2 StatID |b Thomson Reuters Master Journal List |
915 | _ | _ | |a WoS |0 StatID:(DE-HGF)0110 |2 StatID |b Science Citation Index |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0150 |2 StatID |b Web of Science Core Collection |
915 | _ | _ | |a WoS |0 StatID:(DE-HGF)0111 |2 StatID |b Science Citation Index Expanded |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)1150 |2 StatID |b Current Contents - Physical, Chemical and Earth Sciences |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)1160 |2 StatID |b Current Contents - Engineering, Computing and Technology |
915 | _ | _ | |a IF >= 10 |0 StatID:(DE-HGF)9910 |2 StatID |b ADV FUNCT MATER : 2014 |
920 | 1 | _ | |0 I:(DE-Juel1)PGI-7-20110106 |k PGI-7 |l Elektronische Materialien |x 0 |
920 | 1 | _ | |0 I:(DE-Juel1)PGI-5-20110106 |k PGI-5 |l Mikrostrukturforschung |x 1 |
920 | 1 | _ | |0 I:(DE-Juel1)PGI-6-20110106 |k PGI-6 |l Elektronische Eigenschaften |x 2 |
980 | _ | _ | |a journal |
980 | _ | _ | |a VDB |
980 | _ | _ | |a I:(DE-Juel1)PGI-7-20110106 |
980 | _ | _ | |a I:(DE-Juel1)PGI-5-20110106 |
980 | _ | _ | |a I:(DE-Juel1)PGI-6-20110106 |
980 | _ | _ | |a UNRESTRICTED |
980 | _ | _ | |a APC |
981 | _ | _ | |a I:(DE-Juel1)ER-C-1-20170209 |
981 | _ | _ | |a I:(DE-Juel1)PGI-5-20110106 |
981 | _ | _ | |a I:(DE-Juel1)PGI-6-20110106 |
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