000279880 001__ 279880 000279880 005__ 20210129221147.0 000279880 037__ $$aFZJ-2015-07756 000279880 041__ $$aEnglish 000279880 1001_ $$0P:(DE-Juel1)141766$$aRieger, Torsten$$b0$$eCorresponding author 000279880 1112_ $$a18th European Molecular Beam Epitaxy workshop$$cCanazei$$d2015-03-15 - 2015-03-18$$wItaly 000279880 245__ $$aSELF-ASSEMBLED NANOWIRE JUNCTIONS ON PATTERNED Si SUBSTRATES 000279880 260__ $$c2015 000279880 3367_ $$0PUB:(DE-HGF)6$$2PUB:(DE-HGF)$$aConference Presentation$$bconf$$mconf$$s1453470171_7962$$xAfter Call 000279880 3367_ $$033$$2EndNote$$aConference Paper 000279880 3367_ $$2DataCite$$aOther 000279880 3367_ $$2ORCID$$aLECTURE_SPEECH 000279880 3367_ $$2DRIVER$$aconferenceObject 000279880 3367_ $$2BibTeX$$aINPROCEEDINGS 000279880 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0 000279880 7001_ $$0P:(DE-Juel1)167347$$aRosenbach, Daniel$$b1 000279880 7001_ $$0P:(DE-Juel1)140272$$aHeedt, Sebastian$$b2 000279880 7001_ $$0P:(DE-Juel1)128603$$aLepsa, Mihail Ion$$b3 000279880 7001_ $$0P:(DE-Juel1)128634$$aSchäpers, Thomas$$b4 000279880 7001_ $$0P:(DE-Juel1)125588$$aGrützmacher, Detlev$$b5 000279880 909CO $$ooai:juser.fz-juelich.de:279880$$pVDB 000279880 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)141766$$aForschungszentrum Jülich GmbH$$b0$$kFZJ 000279880 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)167347$$aForschungszentrum Jülich GmbH$$b1$$kFZJ 000279880 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)140272$$aForschungszentrum Jülich GmbH$$b2$$kFZJ 000279880 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)128603$$aForschungszentrum Jülich GmbH$$b3$$kFZJ 000279880 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)128634$$aForschungszentrum Jülich GmbH$$b4$$kFZJ 000279880 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)125588$$aForschungszentrum Jülich GmbH$$b5$$kFZJ 000279880 9131_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0 000279880 9141_ $$y2015 000279880 915__ $$0StatID:(DE-HGF)0550$$2StatID$$aNo Authors Fulltext 000279880 920__ $$lyes 000279880 9201_ $$0I:(DE-Juel1)PGI-9-20110106$$kPGI-9$$lHalbleiter-Nanoelektronik$$x0 000279880 980__ $$aconf 000279880 980__ $$aVDB 000279880 980__ $$aUNRESTRICTED 000279880 980__ $$aI:(DE-Juel1)PGI-9-20110106