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| Hauptseite > Publikationsdatenbank > High-k/metal gate stacks on high Sn content GeSn alloys > print |
| Hauptseite > Publikationsdatenbank > High-k/metal gate stacks on high Sn content GeSn alloys > print |
| 001 | 280079 | ||
| 005 | 20210129221212.0 | ||
| 037 | _ | _ | |a FZJ-2015-07826 |
| 041 | _ | _ | |a English |
| 100 | 1 | _ | |a Schulte-Braucks, Christian |0 P:(DE-Juel1)161530 |b 0 |e Corresponding author |
| 111 | 2 | _ | |a Insulating Films on Semiconductors |g INFOS2015 |c Udine |d 2015-06-30 - 2015-07-02 |w Italy |
| 245 | _ | _ | |a High-k/metal gate stacks on high Sn content GeSn alloys |
| 260 | _ | _ | |c 2015 |
| 336 | 7 | _ | |a Conference Presentation |b conf |m conf |0 PUB:(DE-HGF)6 |s 1452684503_2870 |2 PUB:(DE-HGF) |x Other |
| 336 | 7 | _ | |a Conference Paper |0 33 |2 EndNote |
| 336 | 7 | _ | |a Other |2 DataCite |
| 336 | 7 | _ | |a LECTURE_SPEECH |2 ORCID |
| 336 | 7 | _ | |a conferenceObject |2 DRIVER |
| 336 | 7 | _ | |a INPROCEEDINGS |2 BibTeX |
| 536 | _ | _ | |a 521 - Controlling Electron Charge-Based Phenomena (POF3-521) |0 G:(DE-HGF)POF3-521 |c POF3-521 |f POF III |x 0 |
| 536 | _ | _ | |a E2SWITCH - Energy Efficient Tunnel FET Switches and Circuits (619509) |0 G:(EU-Grant)619509 |c 619509 |f FP7-ICT-2013-11 |x 1 |
| 700 | 1 | _ | |a Lehndorff, Thomas |0 P:(DE-HGF)0 |b 1 |
| 700 | 1 | _ | |a von den Driesch, Nils |0 P:(DE-Juel1)161247 |b 2 |
| 700 | 1 | _ | |a Wirths, Stephan |0 P:(DE-Juel1)138778 |b 3 |
| 700 | 1 | _ | |a Mussler, Gregor |0 P:(DE-Juel1)128617 |b 4 |
| 700 | 1 | _ | |a Savenko, Aleksei |0 P:(DE-HGF)0 |b 5 |
| 700 | 1 | _ | |a Breuer, Uwe |0 P:(DE-Juel1)133840 |b 6 |
| 700 | 1 | _ | |a Tiedemann, Andreas |0 P:(DE-Juel1)128639 |b 7 |
| 700 | 1 | _ | |a Hartmann |0 P:(DE-HGF)0 |b 8 |
| 700 | 1 | _ | |a Ikonic |0 P:(DE-HGF)0 |b 9 |
| 909 | C | O | |o oai:juser.fz-juelich.de:280079 |p openaire |p VDB |p ec_fundedresources |
| 910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 0 |6 P:(DE-Juel1)161530 |
| 910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 2 |6 P:(DE-Juel1)161247 |
| 910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 3 |6 P:(DE-Juel1)138778 |
| 910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 4 |6 P:(DE-Juel1)128617 |
| 910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 6 |6 P:(DE-Juel1)133840 |
| 910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 7 |6 P:(DE-Juel1)128639 |
| 910 | 1 | _ | |a External Institute |0 I:(DE-HGF)0 |k Extern |b 8 |6 P:(DE-HGF)0 |
| 913 | 1 | _ | |a DE-HGF |b Key Technologies |l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT) |1 G:(DE-HGF)POF3-520 |0 G:(DE-HGF)POF3-521 |2 G:(DE-HGF)POF3-500 |v Controlling Electron Charge-Based Phenomena |x 0 |4 G:(DE-HGF)POF |3 G:(DE-HGF)POF3 |
| 914 | 1 | _ | |y 2015 |
| 915 | _ | _ | |a No Authors Fulltext |0 StatID:(DE-HGF)0550 |2 StatID |
| 920 | _ | _ | |l yes |
| 920 | 1 | _ | |0 I:(DE-Juel1)PGI-9-20110106 |k PGI-9 |l Halbleiter-Nanoelektronik |x 0 |
| 920 | 1 | _ | |0 I:(DE-82)080009_20140620 |k JARA-FIT |l JARA-FIT |x 1 |
| 920 | 1 | _ | |0 I:(DE-Juel1)ZEA-3-20090406 |k ZEA-3 |l Analytik |x 2 |
| 980 | _ | _ | |a conf |
| 980 | _ | _ | |a VDB |
| 980 | _ | _ | |a UNRESTRICTED |
| 980 | _ | _ | |a I:(DE-Juel1)PGI-9-20110106 |
| 980 | _ | _ | |a I:(DE-82)080009_20140620 |
| 980 | _ | _ | |a I:(DE-Juel1)ZEA-3-20090406 |
| 981 | _ | _ | |a I:(DE-Juel1)ZEA-3-20090406 |
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