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000280290 1001_ $$0P:(DE-HGF)0$$aMarinova, Maya$$b0$$eCorresponding author
000280290 245__ $$aDepth Profiling Charge Accumulation from a Ferroelectric into a Doped Mott Insulator
000280290 260__ $$aWashington, DC$$bACS Publ.$$c2015
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000280290 520__ $$aThe electric field control of functional properties is a crucial goal in oxide-based electronics. Nonvolatile switching between different resistivity or magnetic states in an oxide channel can be achieved through charge accumulation or depletion from an adjacent ferroelectric. However, the way in which charge distributes near the interface between the ferroelectric and the oxide remains poorly known, which limits our understanding of such switching effects. Here, we use a first-of-a-kind combination of scanning transmission electron microscopy with electron energy loss spectroscopy, near-total-reflection hard X-ray photoemission spectroscopy, and ab initio theory to address this issue. We achieve a direct, quantitative, atomic-scale characterization of the polarization-induced charge density changes at the interface between the ferroelectric BiFeO3 and the doped Mott insulator Ca1–xCexMnO3, thus providing insight on how interface-engineering can enhance these switching effects.
000280290 536__ $$0G:(DE-HGF)POF3-522$$a522 - Controlling Spin-Based Phenomena (POF3-522)$$cPOF3-522$$fPOF III$$x0
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000280290 7001_ $$0P:(DE-HGF)0$$aRault, Julien E.$$b1
000280290 7001_ $$0P:(DE-HGF)0$$aGloter, Alexandre$$b2
000280290 7001_ $$0P:(DE-Juel1)164137$$aNemsak, Slavomir$$b3
000280290 7001_ $$0P:(DE-HGF)0$$aPalsson, Gunnar K.$$b4
000280290 7001_ $$0P:(DE-HGF)0$$aRueff, Jean-Pascal$$b5
000280290 7001_ $$0P:(DE-HGF)0$$aFadley, Charles S.$$b6
000280290 7001_ $$0P:(DE-HGF)0$$aCarrétéro, Cécile$$b7
000280290 7001_ $$0P:(DE-HGF)0$$aYamada, Hiroyuki$$b8
000280290 7001_ $$0P:(DE-HGF)0$$aMarch, Katia$$b9
000280290 7001_ $$0P:(DE-HGF)0$$aGarcia, Vincent$$b10
000280290 7001_ $$0P:(DE-HGF)0$$aFusil, Stéphane$$b11
000280290 7001_ $$0P:(DE-HGF)0$$aBarthélémy, Agnès$$b12
000280290 7001_ $$0P:(DE-HGF)0$$aStéphan, Odile$$b13
000280290 7001_ $$0P:(DE-HGF)0$$aColliex, Christian$$b14
000280290 7001_ $$0P:(DE-HGF)0$$aBibes, Manuel$$b15
000280290 773__ $$0PERI:(DE-600)2048866-X$$a10.1021/acs.nanolett.5b00104$$gVol. 15, no. 4, p. 2533 - 2541$$n4$$p2533 - 2541$$tNano letters$$v15$$x1530-6992$$y2015
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