000280882 001__ 280882
000280882 005__ 20220930130055.0
000280882 0247_ $$2doi$$a10.1002/adma.201502574
000280882 0247_ $$2ISSN$$a0935-9648
000280882 0247_ $$2ISSN$$a1521-4095
000280882 0247_ $$2WOS$$aWOS:000363476200019
000280882 0247_ $$2altmetric$$aaltmetric:4564285
000280882 0247_ $$2pmid$$apmid:26456484
000280882 037__ $$aFZJ-2016-00593
000280882 041__ $$aEnglish
000280882 082__ $$a540
000280882 1001_ $$0P:(DE-Juel1)162283$$aLübben, Michael$$b0
000280882 245__ $$aGraphene-Modified Interface Controls Transition from VCM to ECM Switching Modes in Ta/TaO x Based Memristive Devices
000280882 260__ $$aWeinheim$$bWiley-VCH$$c2015
000280882 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1453206173_25280
000280882 3367_ $$2DataCite$$aOutput Types/Journal article
000280882 3367_ $$00$$2EndNote$$aJournal Article
000280882 3367_ $$2BibTeX$$aARTICLE
000280882 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000280882 3367_ $$2DRIVER$$aarticle
000280882 520__ $$aBy modification of the electrode–solid-electrolyte interface with graphene, transit from valence change memories (VCM) to electrochemical metallization memories (ECM) in the cell Ta(C)/Ta2O5/Pt is demonstrated, thus, bridging both mechanisms. The ECM operation is discussed in the light of Ta-cation mobility in TaOx. The crucial role of electrochemical processes and moisture in the resistive switching process is also highlighted.
000280882 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
000280882 588__ $$aDataset connected to CrossRef
000280882 7001_ $$0P:(DE-HGF)0$$aKarakolis, Panagiotis$$b1
000280882 7001_ $$0P:(DE-HGF)0$$aIoannou-Sougleridis, Vassilios$$b2
000280882 7001_ $$0P:(DE-HGF)0$$aNormand, Pascal$$b3
000280882 7001_ $$0P:(DE-HGF)0$$aDimitrakis, Panagiotis$$b4
000280882 7001_ $$0P:(DE-Juel1)131014$$aValov, Ilia$$b5$$eCorresponding author
000280882 773__ $$0PERI:(DE-600)1474949-x$$a10.1002/adma.201502574$$gVol. 27, no. 40, p. 6202 - 6207$$n40$$p6202 - 6207$$tAdvanced materials$$v27$$x0935-9648$$y2015
000280882 8564_ $$uhttps://juser.fz-juelich.de/record/280882/files/L-bben_et_al-2015-Advanced_Materials.pdf$$yRestricted
000280882 8564_ $$uhttps://juser.fz-juelich.de/record/280882/files/L-bben_et_al-2015-Advanced_Materials.gif?subformat=icon$$xicon$$yRestricted
000280882 8564_ $$uhttps://juser.fz-juelich.de/record/280882/files/L-bben_et_al-2015-Advanced_Materials.jpg?subformat=icon-1440$$xicon-1440$$yRestricted
000280882 8564_ $$uhttps://juser.fz-juelich.de/record/280882/files/L-bben_et_al-2015-Advanced_Materials.jpg?subformat=icon-180$$xicon-180$$yRestricted
000280882 8564_ $$uhttps://juser.fz-juelich.de/record/280882/files/L-bben_et_al-2015-Advanced_Materials.jpg?subformat=icon-640$$xicon-640$$yRestricted
000280882 8564_ $$uhttps://juser.fz-juelich.de/record/280882/files/L-bben_et_al-2015-Advanced_Materials.pdf?subformat=pdfa$$xpdfa$$yRestricted
000280882 8767_ $$92015-10-28$$d2015-11-05$$eColour charges$$jZahlung erfolgt
000280882 909CO $$ooai:juser.fz-juelich.de:280882$$pOpenAPC$$pVDB$$popenCost
000280882 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)162283$$aForschungszentrum Jülich GmbH$$b0$$kFZJ
000280882 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)131014$$aForschungszentrum Jülich GmbH$$b5$$kFZJ
000280882 9131_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0
000280882 9141_ $$y2015
000280882 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000280882 915__ $$0StatID:(DE-HGF)1160$$2StatID$$aDBCoverage$$bCurrent Contents - Engineering, Computing and Technology
000280882 915__ $$0StatID:(DE-HGF)9915$$2StatID$$aIF >= 15$$bADV MATER : 2014
000280882 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bADV MATER : 2014
000280882 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000280882 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000280882 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000280882 915__ $$0StatID:(DE-HGF)0550$$2StatID$$aNo Authors Fulltext
000280882 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences
000280882 915__ $$0StatID:(DE-HGF)0310$$2StatID$$aDBCoverage$$bNCBI Molecular Biology Database
000280882 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000280882 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz
000280882 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000280882 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
000280882 980__ $$ajournal
000280882 980__ $$aVDB
000280882 980__ $$aUNRESTRICTED
000280882 980__ $$aI:(DE-Juel1)PGI-7-20110106
000280882 980__ $$aAPC