000280884 001__ 280884
000280884 005__ 20210129221434.0
000280884 0247_ $$2doi$$a10.1002/xrs.2637
000280884 0247_ $$2ISSN$$a0049-8246
000280884 0247_ $$2ISSN$$a1097-4539
000280884 0247_ $$2WOS$$aWOS:000360088600005
000280884 037__ $$aFZJ-2016-00595
000280884 041__ $$aEnglish
000280884 082__ $$a530
000280884 1001_ $$0P:(DE-HGF)0$$aKubacki, Jerzy$$b0$$eCorresponding author
000280884 245__ $$aX-ray absorption and resonant photoemission studies of electroforming process in Fe-doped SrTiO 3 epitaxial films
000280884 260__ $$aNew York, NY [u.a.]$$bWiley$$c2015
000280884 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1453293002_22396
000280884 3367_ $$2DataCite$$aOutput Types/Journal article
000280884 3367_ $$00$$2EndNote$$aJournal Article
000280884 3367_ $$2BibTeX$$aARTICLE
000280884 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000280884 3367_ $$2DRIVER$$aarticle
000280884 520__ $$aThis work presents the results of the electronic structure investigations of epitaxial 2% Fe-doped SrTiO3 film. The electroforming process of the film was performed inside the ultra-high vacuum test chamber by applying positive 10 V bias to the film with the use of the aluminium ‘brush’ electrode. The X-ray absorption and resonant photoemission methods were used to study the effect of Fe doping and electroformation on the electronic structure of the SrTiO3 films. Analysis of the valence band revealed the increase of the photoelectron intensity in the band gap region as the result of Fe doping. Electroformation caused a slight variation of the iron originating electronic states derived from the resonant photoemission, which can probably be related to the increasing contribution from the Fe2+ ions with respect to the Fe3+ ones. The titanium partial density of states showed an increase in the band gap region after the electroformation process. The significant decreases of the iron concentration derived from the photoemission spectra were found after electroforming procedure. The observed changes can be related to the increased migration of oxygen and possibly also iron ions provoked by a strong electric field applied by the electrode, eventually leading to modification of the local electronic structure. 
000280884 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
000280884 588__ $$aDataset connected to CrossRef
000280884 7001_ $$0P:(DE-HGF)0$$aKajewski, Dariusz$$b1
000280884 7001_ $$0P:(DE-HGF)0$$aKoehl, Annemarie$$b2
000280884 7001_ $$0P:(DE-Juel1)138081$$aLenser, Christian$$b3
000280884 7001_ $$0P:(DE-Juel1)130620$$aDittmann, Regina$$b4
000280884 7001_ $$0P:(DE-HGF)0$$aSzade, Jacek$$b5
000280884 773__ $$0PERI:(DE-600)1479999-6$$a10.1002/xrs.2637$$gVol. 44, no. 5, p. 339 - 343$$n5$$p339 - 343$$tX-ray spectrometry$$v44$$x0049-8246$$y2015
000280884 909CO $$ooai:juser.fz-juelich.de:280884$$pVDB
000280884 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-HGF)0$$aForschungszentrum Jülich GmbH$$b2$$kFZJ
000280884 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)138081$$aForschungszentrum Jülich GmbH$$b3$$kFZJ
000280884 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130620$$aForschungszentrum Jülich GmbH$$b4$$kFZJ
000280884 9131_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0
000280884 9141_ $$y2015
000280884 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000280884 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bX-RAY SPECTROM : 2014
000280884 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000280884 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000280884 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000280884 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5
000280884 915__ $$0StatID:(DE-HGF)0550$$2StatID$$aNo Authors Fulltext
000280884 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences
000280884 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz
000280884 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000280884 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
000280884 980__ $$ajournal
000280884 980__ $$aVDB
000280884 980__ $$aUNRESTRICTED
000280884 980__ $$aI:(DE-Juel1)PGI-7-20110106