%0 Journal Article
%A Zhu, X. D.
%A Wicklein, Sebastian
%A Gunkel, Felix
%A Xiao, Rui
%A Dittmann, Regina
%T In situ optical characterization of LaAlO 3 epitaxy on SrTiO 3 (001)
%J epl
%V 109
%N 3
%@ 0295-5075
%C Les-Ulis
%I EDP Science65224
%M FZJ-2016-00599
%P 37006
%D 2015
%X We followed the growth of LaAlO3 (LAO) on TiO2-terminated SrTiO3(001) in situ using a combination of a special monochromatic ellipsometry at photon energy of 1.96 eV and reflection high-energy electron diffraction (RHEED). We find that the phase of the ellipsometric ratio, defined as $\rho\equiv r_{\text{p}}/r_{\text{s}} \equiv \tan\Psi \exp(i\Delta)$ , changes linearly with the LAO film thickness. From the 4th unit cell (uc) up to the 11th unit cell, the slope of change in Δ is different from that for the initial three unit cells and yet there is no abrupt change in Δ when the LAO thickness increases from 3 uc to 4 uc. We explore structural and electronic processes in the LaAlO3-SrTiO3system that may be responsible for such an in situ observed optical response.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000351660100023
%R 10.1209/0295-5075/109/37006
%U https://juser.fz-juelich.de/record/280888