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000280888 1001_ $$0P:(DE-HGF)0$$aZhu, X. D.$$b0$$eCorresponding author
000280888 245__ $$aIn situ optical characterization of LaAlO 3 epitaxy on SrTiO 3 (001)
000280888 260__ $$aLes-Ulis$$bEDP Science65224$$c2015
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000280888 520__ $$aWe followed the growth of LaAlO3 (LAO) on TiO2-terminated SrTiO3(001) in situ using a combination of a special monochromatic ellipsometry at photon energy of 1.96 eV and reflection high-energy electron diffraction (RHEED). We find that the phase of the ellipsometric ratio, defined as $\rho\equiv r_{\text{p}}/r_{\text{s}} \equiv \tan\Psi \exp(i\Delta)$ , changes linearly with the LAO film thickness. From the 4th unit cell (uc) up to the 11th unit cell, the slope of change in Δ is different from that for the initial three unit cells and yet there is no abrupt change in Δ when the LAO thickness increases from 3 uc to 4 uc. We explore structural and electronic processes in the LaAlO3-SrTiO3system that may be responsible for such an in situ observed optical response.
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000280888 7001_ $$0P:(DE-Juel1)138749$$aWicklein, Sebastian$$b1
000280888 7001_ $$0P:(DE-Juel1)130677$$aGunkel, Felix$$b2
000280888 7001_ $$0P:(DE-HGF)0$$aXiao, Rui$$b3
000280888 7001_ $$0P:(DE-Juel1)130620$$aDittmann, Regina$$b4
000280888 77318 $$2Crossref$$3journal-article$$a10.1209/0295-5075/109/37006$$b : IOP Publishing, 2015-02-01$$n3$$p37006$$tEPL (Europhysics Letters)$$v109$$x0295-5075$$y2015
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