TY  - JOUR
AU  - Zhu, X. D.
AU  - Wicklein, Sebastian
AU  - Gunkel, Felix
AU  - Xiao, Rui
AU  - Dittmann, Regina
TI  - In situ optical characterization of LaAlO 3 epitaxy on SrTiO 3 (001)
JO  - epl
VL  - 109
IS  - 3
SN  - 0295-5075
CY  - Les-Ulis
PB  - EDP Science65224
M1  - FZJ-2016-00599
SP  - 37006
PY  - 2015
AB  - We followed the growth of LaAlO3 (LAO) on TiO2-terminated SrTiO3(001) in situ using a combination of a special monochromatic ellipsometry at photon energy of 1.96 eV and reflection high-energy electron diffraction (RHEED). We find that the phase of the ellipsometric ratio, defined as $\rho\equiv r_{\text{p}}/r_{\text{s}} \equiv \tan\Psi \exp(i\Delta)$ , changes linearly with the LAO film thickness. From the 4th unit cell (uc) up to the 11th unit cell, the slope of change in Δ is different from that for the initial three unit cells and yet there is no abrupt change in Δ when the LAO thickness increases from 3 uc to 4 uc. We explore structural and electronic processes in the LaAlO3-SrTiO3system that may be responsible for such an in situ observed optical response.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000351660100023
DO  - DOI:10.1209/0295-5075/109/37006
UR  - https://juser.fz-juelich.de/record/280888
ER  -