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@ARTICLE{Zhu:280888,
author = {Zhu, X. D. and Wicklein, Sebastian and Gunkel, Felix and
Xiao, Rui and Dittmann, Regina},
title = {{I}n situ optical characterization of {L}a{A}l{O} 3 epitaxy
on {S}r{T}i{O} 3 (001)},
journal = {epl},
volume = {109},
number = {3},
issn = {0295-5075},
address = {Les-Ulis},
publisher = {EDP Science65224},
reportid = {FZJ-2016-00599},
pages = {37006},
year = {2015},
abstract = {We followed the growth of LaAlO3 (LAO) on TiO2-terminated
SrTiO3(001) in situ using a combination of a special
monochromatic ellipsometry at photon energy of 1.96 eV and
reflection high-energy electron diffraction (RHEED). We find
that the phase of the ellipsometric ratio, defined as
$\rho\equiv r_{\text{p}}/r_{\text{s}} \equiv \tan\Psi
\exp(i\Delta)$ , changes linearly with the LAO film
thickness. From the 4th unit cell (uc) up to the 11th unit
cell, the slope of change in Δ is different from that for
the initial three unit cells and yet there is no abrupt
change in Δ when the LAO thickness increases from 3 uc to 4
uc. We explore structural and electronic processes in the
LaAlO3-SrTiO3system that may be responsible for such an in
situ observed optical response.},
cin = {PGI-7},
ddc = {530},
cid = {I:(DE-Juel1)PGI-7-20110106},
pnm = {521 - Controlling Electron Charge-Based Phenomena
(POF3-521)},
pid = {G:(DE-HGF)POF3-521},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000351660100023},
doi = {10.1209/0295-5075/109/37006},
url = {https://juser.fz-juelich.de/record/280888},
}