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000280897 037__ $$aFZJ-2016-00608
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000280897 1001_ $$0P:(DE-HGF)0$$aLa Torre, C.$$b0
000280897 1112_ $$aNanoelectronics Days$$cJülich$$d2015-04-27 - 2015-04-30$$wGermany
000280897 245__ $$aParameter Study of HfOx-based ReRAM
000280897 260__ $$c2015
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000280897 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
000280897 7001_ $$0P:(DE-HGF)0$$aKühn, M.$$b1
000280897 7001_ $$0P:(DE-HGF)0$$aStarschich, S.$$b2
000280897 7001_ $$0P:(DE-Juel1)158062$$aMenzel, Stephan$$b3$$ufzj
000280897 7001_ $$0P:(DE-HGF)0$$aBöttger, U$$b4
000280897 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b5$$ufzj
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000280897 9141_ $$y2015
000280897 915__ $$0StatID:(DE-HGF)0550$$2StatID$$aNo Authors Fulltext
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