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001     280897
005     20210129221436.0
037 _ _ |a FZJ-2016-00608
041 _ _ |a English
100 1 _ |a La Torre, C.
|0 P:(DE-HGF)0
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111 2 _ |a Nanoelectronics Days
|c Jülich
|d 2015-04-27 - 2015-04-30
|w Germany
245 _ _ |a Parameter Study of HfOx-based ReRAM
260 _ _ |c 2015
336 7 _ |a Poster
|b poster
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|s 1453478575_7962
|2 PUB:(DE-HGF)
336 7 _ |a Conference Paper
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336 7 _ |a Output Types/Conference Poster
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336 7 _ |a conferenceObject
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336 7 _ |a CONFERENCE_POSTER
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336 7 _ |a INPROCEEDINGS
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536 _ _ |a 521 - Controlling Electron Charge-Based Phenomena (POF3-521)
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700 1 _ |a Kühn, M.
|0 P:(DE-HGF)0
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700 1 _ |a Starschich, S.
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700 1 _ |a Menzel, Stephan
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700 1 _ |a Böttger, U
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700 1 _ |a Waser, R.
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909 C O |o oai:juser.fz-juelich.de:280897
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910 1 _ |a Forschungszentrum Jülich GmbH
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910 1 _ |a Forschungszentrum Jülich GmbH
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913 1 _ |a DE-HGF
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|l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)
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|v Controlling Electron Charge-Based Phenomena
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914 1 _ |y 2015
915 _ _ |a No Authors Fulltext
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920 1 _ |0 I:(DE-Juel1)PGI-7-20110106
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980 _ _ |a poster
980 _ _ |a VDB
980 _ _ |a UNRESTRICTED
980 _ _ |a I:(DE-Juel1)PGI-7-20110106

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