Hauptseite > Publikationsdatenbank > Measurement and Modeling of the Cycle-to-Cycle Variability of the SET Switching Time in HfOx-based ReRAM > print

001     280898
005     20210129221436.0
037 _ _ |a FZJ-2016-00609
041 _ _ |a English
100 1 _ |a La Torre, C.
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111 2 _ |a European Materials Research Society meeting
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|d 2015-05-11 - 2015-05-15
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245 _ _ |a Measurement and Modeling of the Cycle-to-Cycle Variability of the SET Switching Time in HfOx-based ReRAM
260 _ _ |c 2015
336 7 _ |a Conference Presentation
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336 7 _ |a Conference Paper
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336 7 _ |a Other
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336 7 _ |a LECTURE_SPEECH
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336 7 _ |a conferenceObject
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336 7 _ |a INPROCEEDINGS
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536 _ _ |a 521 - Controlling Electron Charge-Based Phenomena (POF3-521)
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700 1 _ |a Starschich, S
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700 1 _ |a Fleck, K.
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700 1 _ |a Linn, E
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700 1 _ |a Waser, R.
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700 1 _ |a Menzel, Stephan
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910 1 _ |a Forschungszentrum Jülich GmbH
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910 1 _ |a Forschungszentrum Jülich GmbH
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|v Controlling Electron Charge-Based Phenomena
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914 1 _ |y 2015
915 _ _ |a No Authors Fulltext
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920 1 _ |0 I:(DE-Juel1)PGI-7-20110106
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980 _ _ |a I:(DE-Juel1)PGI-7-20110106

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