TY  - JOUR
AU  - Lüpke, F.
AU  - Korte, S.
AU  - Cherepanov, V.
AU  - Voigtländer, Bert
TI  - Scanning tunneling potentiometry implemented into a multi-tip setup by software
JO  - Review of scientific instruments
VL  - 86
IS  - 12
SN  - 1089-7623
CY  - [S.l.]
PB  - American Institute of Physics
M1  - FZJ-2016-00630
SP  - 123701 -
PY  - 2015
AB  - We present a multi-tip scanning tunneling potentiometry technique that can be implemented into existing multi-tip scanning tunneling microscopes without installation of additional hardware. The resulting setup allows flexible in situ contacting of samples under UHV conditions and subsequent measurement of the sample topography and local electric potential with resolution down to Å and μV, respectively. The performance of the potentiometry feedback is demonstrated by thermovoltage measurements on the Ag/Si(111)−(3√×3√)R30∘Ag/Si(111)−(3×3)R30∘surface by resolving a standing wave pattern. Subsequently, the ability to map the local transport field as a result of a lateral current through the sample surface is shown on Ag/Si(111)−(3√×3√)R30∘Ag/Si(111)−(3×3)R30∘ and Si(111) − (7 × 7) surfaces.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000368594900038
C6  - pmid:26724036
DO  - DOI:10.1063/1.4936079
UR  - https://juser.fz-juelich.de/record/280919
ER  -