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@ARTICLE{Lpke:280919,
author = {Lüpke, F. and Korte, S. and Cherepanov, V. and
Voigtländer, Bert},
title = {{S}canning tunneling potentiometry implemented into a
multi-tip setup by software},
journal = {Review of scientific instruments},
volume = {86},
number = {12},
issn = {1089-7623},
address = {[S.l.]},
publisher = {American Institute of Physics},
reportid = {FZJ-2016-00630},
pages = {123701 -},
year = {2015},
abstract = {We present a multi-tip scanning tunneling potentiometry
technique that can be implemented into existing multi-tip
scanning tunneling microscopes without installation of
additional hardware. The resulting setup allows flexible in
situ contacting of samples under UHV conditions and
subsequent measurement of the sample topography and local
electric potential with resolution down to Å and μV,
respectively. The performance of the potentiometry feedback
is demonstrated by thermovoltage measurements on the
Ag/Si(111)−(3√×3√)R30∘Ag/Si(111)−(3×3)R30∘surface
by resolving a standing wave pattern. Subsequently, the
ability to map the local transport field as a result of a
lateral current through the sample surface is shown on
Ag/Si(111)−(3√×3√)R30∘Ag/Si(111)−(3×3)R30∘ and
Si(111) − (7 × 7) surfaces.},
cin = {PGI-3},
ddc = {530},
cid = {I:(DE-Juel1)PGI-3-20110106},
pnm = {141 - Controlling Electron Charge-Based Phenomena
(POF3-141)},
pid = {G:(DE-HGF)POF3-141},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000368594900038},
pubmed = {pmid:26724036},
doi = {10.1063/1.4936079},
url = {https://juser.fz-juelich.de/record/280919},
}