TY  - JOUR
AU  - Morawski, Ireneusz
AU  - Spiegelberg, Richard
AU  - Korte, Stefan
AU  - Voigtländer, Bert
TI  - Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications
JO  - Review of scientific instruments
VL  - 86
IS  - 12
SN  - 1089-7623
CY  - [S.l.]
PB  - American Institute of Physics
M1  - FZJ-2016-00632
SP  - 123703 -
PY  - 2015
AB  - A method which allows scanning tunneling microscopy(STM) tip biasing independent of the sample bias during frequency modulated atomic force microscopy(AFM) operation is presented. The AFM sensor is supplied by an electronic circuit combining both a frequency shift signal and a tunneling current signal by means of an inductive coupling. This solution enables a control of the tip potential independent of the sample potential. Individual tip biasing is specifically important in order to implement multi-tip STM/AFM applications. An extensional quartz sensor (needle sensor) with a conductive tip is applied to record simultaneously topography and conductivity of the sample. The high resonance frequency of the needle sensor (1 MHz) allows scanning of a large area of the surface being investigated in a reasonably short time. A recipe for the amplitude calibration which is based only on the frequency shift signal and does not require the tip being in contact is presented. Additionally, we show spectral measurements of the mechanical vibration noise of the scanning system used in the investigations.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000368594900040
DO  - DOI:10.1063/1.4936975
UR  - https://juser.fz-juelich.de/record/280921
ER  -