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@ARTICLE{Morawski:280921,
      author       = {Morawski, Ireneusz and Spiegelberg, Richard and Korte,
                      Stefan and Voigtländer, Bert},
      title        = {{C}ombined frequency modulated atomic force microscopy and
                      scanning tunneling microscopy detection for multi-tip
                      scanning probe microscopy applications},
      journal      = {Review of scientific instruments},
      volume       = {86},
      number       = {12},
      issn         = {1089-7623},
      address      = {[S.l.]},
      publisher    = {American Institute of Physics},
      reportid     = {FZJ-2016-00632},
      pages        = {123703 -},
      year         = {2015},
      abstract     = {A method which allows scanning tunneling microscopy(STM)
                      tip biasing independent of the sample bias during frequency
                      modulated atomic force microscopy(AFM) operation is
                      presented. The AFM sensor is supplied by an electronic
                      circuit combining both a frequency shift signal and a
                      tunneling current signal by means of an inductive coupling.
                      This solution enables a control of the tip potential
                      independent of the sample potential. Individual tip biasing
                      is specifically important in order to implement multi-tip
                      STM/AFM applications. An extensional quartz sensor (needle
                      sensor) with a conductive tip is applied to record
                      simultaneously topography and conductivity of the sample.
                      The high resonance frequency of the needle sensor (1 MHz)
                      allows scanning of a large area of the surface being
                      investigated in a reasonably short time. A recipe for the
                      amplitude calibration which is based only on the frequency
                      shift signal and does not require the tip being in contact
                      is presented. Additionally, we show spectral measurements of
                      the mechanical vibration noise of the scanning system used
                      in the investigations.},
      cin          = {PGI-3 / JARA-FIT},
      ddc          = {530},
      cid          = {I:(DE-Juel1)PGI-3-20110106 / $I:(DE-82)080009_20140620$},
      pnm          = {141 - Controlling Electron Charge-Based Phenomena
                      (POF3-141)},
      pid          = {G:(DE-HGF)POF3-141},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000368594900040},
      doi          = {10.1063/1.4936975},
      url          = {https://juser.fz-juelich.de/record/280921},
}