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@INPROCEEDINGS{Xu:281003,
      author       = {Xu, Chengcheng and Zhu, X. D. and Gunkel, Felix and Xiao,
                      R. and Dittmann, Regina},
      title        = {{O}blique incidence reflectance difference spectroscopy
                      ({OIRD}) for real-time optical observation of the formation
                      of the conducting and insulating interface between
                      {L}a{A}l{O}3 and {S}r{T}i{O}3},
      reportid     = {FZJ-2016-00714},
      year         = {2015},
      month         = {Feb},
      date          = {2015-02-23},
      organization  = {9th Workshop Ellipsometry, Twente
                       (Netherlands), 23 Feb 2015 - 25 Feb
                       2015},
      cin          = {PGI-7},
      cid          = {I:(DE-Juel1)PGI-7-20110106},
      pnm          = {521 - Controlling Electron Charge-Based Phenomena
                      (POF3-521)},
      pid          = {G:(DE-HGF)POF3-521},
      typ          = {PUB:(DE-HGF)24},
      url          = {https://juser.fz-juelich.de/record/281003},
}