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001     281033
005     20210129221607.0
037 _ _ |a FZJ-2016-00744
041 _ _ |a English
100 1 _ |a Fleck, K.
|0 P:(DE-HGF)0
|b 0
111 2 _ |a European Materials Research Society meeting
|c San Francisco
|d 2015-04-20 - 2015-04-24
|w USA
245 _ _ |a SET and RESET kinetics in SrTiO3 based resistive memory devices
260 _ _ |c 2015
336 7 _ |a Conference Presentation
|b conf
|m conf
|0 PUB:(DE-HGF)6
|s 1453379884_2879
|2 PUB:(DE-HGF)
|x Other
336 7 _ |a Conference Paper
|0 33
|2 EndNote
336 7 _ |a Other
|2 DataCite
336 7 _ |a LECTURE_SPEECH
|2 ORCID
336 7 _ |a conferenceObject
|2 DRIVER
336 7 _ |a INPROCEEDINGS
|2 BibTeX
536 _ _ |a 521 - Controlling Electron Charge-Based Phenomena (POF3-521)
|0 G:(DE-HGF)POF3-521
|c POF3-521
|f POF III
|x 0
700 1 _ |a Böttger, U.
|0 P:(DE-HGF)0
|b 1
700 1 _ |a Waser, R.
|0 P:(DE-Juel1)131022
|b 2
|u fzj
700 1 _ |a Menzel, Stephan
|0 P:(DE-Juel1)158062
|b 3
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909 C O |o oai:juser.fz-juelich.de:281033
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910 1 _ |a Forschungszentrum Jülich GmbH
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910 1 _ |a Forschungszentrum Jülich GmbH
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913 1 _ |a DE-HGF
|b Key Technologies
|l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)
|1 G:(DE-HGF)POF3-520
|0 G:(DE-HGF)POF3-521
|2 G:(DE-HGF)POF3-500
|v Controlling Electron Charge-Based Phenomena
|x 0
|4 G:(DE-HGF)POF
|3 G:(DE-HGF)POF3
914 1 _ |y 2015
915 _ _ |a No Authors Fulltext
|0 StatID:(DE-HGF)0550
|2 StatID
920 1 _ |0 I:(DE-Juel1)PGI-7-20110106
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|l Elektronische Materialien
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980 _ _ |a conf
980 _ _ |a VDB
980 _ _ |a UNRESTRICTED
980 _ _ |a I:(DE-Juel1)PGI-7-20110106

LibraryCollectionCLSMajorCLSMinorLanguageAuthor
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