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@INPROCEEDINGS{Gunkel:281082,
      author       = {Gunkel, Felix and Heinen, Ronja and Wicklein, Sebastian and
                      Hoffmann-Eifert, Susanne and Meuffels, Paul and Brings, P.
                      and Huijben, M. and Rijnders, G. and Waser, R. and Dittmann,
                      Regina},
      title        = {{T}ransport limits in defect-engineered
                      {L}a{A}l{O}3/{S}r{T}i{O}3 bilayers},
      reportid     = {FZJ-2016-00787},
      year         = {2015},
      month         = {Sep},
      date          = {2016-09-12},
      organization  = {COST Action - Towards oxide-based
                       electronics, Aveiro (Portugal), 12 Sep
                       2016 - 16 Sep 2016},
      subtyp        = {Other},
      cin          = {PGI-7},
      cid          = {I:(DE-Juel1)PGI-7-20110106},
      pnm          = {521 - Controlling Electron Charge-Based Phenomena
                      (POF3-521)},
      pid          = {G:(DE-HGF)POF3-521},
      typ          = {PUB:(DE-HGF)6},
      url          = {https://juser.fz-juelich.de/record/281082},
}