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@INPROCEEDINGS{Dittmann:281092,
      author       = {Dittmann, Regina and Raab, Nicolas and Bäumer, Christoph
                      and Waser, R.},
      title        = {{I}mpact of defects and interfaces on the retention
                      behavior of resistively switching {S}r{T}i{O}3 devices},
      reportid     = {FZJ-2016-00797},
      year         = {2015},
      month         = {May},
      date          = {2015-05-11},
      organization  = {European Materials Research Society
                       meeting, Lille (France), 11 May 2015 -
                       15 May 2015},
      subtyp        = {Other},
      cin          = {PGI-7},
      cid          = {I:(DE-Juel1)PGI-7-20110106},
      pnm          = {521 - Controlling Electron Charge-Based Phenomena
                      (POF3-521)},
      pid          = {G:(DE-HGF)POF3-521},
      typ          = {PUB:(DE-HGF)6},
      url          = {https://juser.fz-juelich.de/record/281092},
}