%0 Conference Paper
%A Wouters, D. J.
%A Schönhals, A.
%A Kindsmüller, A.
%A Kim, Wonjoo
%A Breuer, Thomas
%A Marchewka, A.
%A Rana, Vikas
%A Menzel, Stephan
%A Waser, R.
%T Electrical Probing of Key Metal Cap Layer Induced Material Processes Influencing Metal-Oxide Based ReRAM Operation
%M FZJ-2016-00811
%D 2015
%B Materials Research Society Meeting
%C 30 Nov 2015 - 4 Dec 2015, Boston (Germany)
Y2 30 Nov 2015 - 4 Dec 2015
M2 Boston, Germany
%F PUB:(DE-HGF)6
%9 Conference Presentation
%U https://juser.fz-juelich.de/record/281106