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000281106 041__ $$aEnglish
000281106 1001_ $$0P:(DE-HGF)0$$aWouters, D. J.$$b0
000281106 1112_ $$aMaterials Research Society Meeting$$cBoston$$d2015-11-30 - 2015-12-04$$wGermany
000281106 245__ $$aElectrical Probing of Key Metal Cap Layer Induced Material Processes Influencing Metal-Oxide Based ReRAM Operation
000281106 260__ $$c2015
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000281106 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
000281106 7001_ $$0P:(DE-HGF)0$$aSchönhals, A.$$b1
000281106 7001_ $$0P:(DE-HGF)0$$aKindsmüller, A.$$b2
000281106 7001_ $$0P:(DE-Juel1)159348$$aKim, Wonjoo$$b3$$ufzj
000281106 7001_ $$0P:(DE-Juel1)157669$$aBreuer, Thomas$$b4$$ufzj
000281106 7001_ $$0P:(DE-HGF)0$$aMarchewka, A.$$b5
000281106 7001_ $$0P:(DE-Juel1)145504$$aRana, Vikas$$b6$$ufzj
000281106 7001_ $$0P:(DE-Juel1)158062$$aMenzel, Stephan$$b7$$ufzj
000281106 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b8$$ufzj
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000281106 9141_ $$y2015
000281106 915__ $$0StatID:(DE-HGF)0550$$2StatID$$aNo Authors Fulltext
000281106 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
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