TY  - CONF
AU  - Wouters, D. J.
AU  - Schönhals, A.
AU  - Kindsmüller, A.
AU  - Kim, Wonjoo
AU  - Breuer, Thomas
AU  - Marchewka, A.
AU  - Rana, Vikas
AU  - Menzel, Stephan
AU  - Waser, R.
TI  - Electrical Probing of Key Metal Cap Layer Induced Material Processes Influencing Metal-Oxide Based ReRAM Operation
M1  - FZJ-2016-00811
PY  - 2015
T2  - Materials Research Society Meeting
CY  - 30 Nov 2015 - 4 Dec 2015, Boston (Germany)
Y2  - 30 Nov 2015 - 4 Dec 2015
M2  - Boston, Germany
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/281106
ER  -