Conference Presentation (Other)

FZJ-2016-00811

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Electrical Probing of Key Metal Cap Layer Induced Material Processes Influencing Metal-Oxide Based ReRAM Operation

Wouters, D. J. ; Schönhals, A. ; Kindsmüller, A. ; Kim, W.FZJ* ; Breuer, T.FZJ* ; Marchewka, A. ; Rana, V.FZJ* ; Menzel, S.FZJ* ; Waser, R.FZJ*

2015

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Contributing Institute(s):

1. Elektronische Materialien (PGI-7)

Research Program(s):

1. 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)

Appears in the scientific report 2015

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Database coverage:
No Authors Fulltext

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