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@ARTICLE{Guillemaut:281587,
author = {Guillemaut, C. and Jardin, A. and Horacek, J. and
Borodkina, I. and Autricque, A. and Arnoux, G. and Boom, J.
and Brezinsek, S. and Coenen, J. W. and De La Luna, E. and
Devaux, S. and Eich, T. and Harting, D. and Kirschner, A.
and Lipschultz, B. and Matthews, G. F. and Meigs, A. and
Moulton, D. and O’Mullane, M. and Stamp, M.},
title = {{E}xperimental estimation of tungsten impurity sputtering
due to {T}ype {I} {ELM}s in {JET}-{ITER}-like wall using
pedestal electron cyclotron emission and target {L}angmuir
probe measurements},
journal = {Physica scripta},
volume = {T167},
issn = {1402-4896},
address = {Bristol},
publisher = {IoP Publ.},
reportid = {FZJ-2016-01276},
pages = {014005 -},
year = {2016},
abstract = {The ITER baseline scenario, with 500 MW of DT fusion power
and Q = 10, will rely on a Type I ELMy H-mode and will be
achieved with a tungsten (W) divertor. W atoms sputtered
from divertor targets during mitigated ELMs are expected to
be the dominant source in ITER. W impurity concentration in
the plasma core can dramatically degrade its performance and
lead to potentially damaging disruptions. Understanding the
physics of the target W source due to sputtering during ELMs
and inter-ELMs is important and can be helped by
experimental measurements with improved precision. It has
been established that the ELMy target ion impact energy has
a simple linear dependence with the pedestal electron
temperature measured by Electron Cyclotron Emission (ECE).
It has also been shown that Langmuir Probes (LP) ion flux
measurements are reliable during ELMs due to the
surprisingly low electron temperature. Therefore, in this
paper, LP and ECE measurements in JET-ITER-Like-Wall (ILW)
unseeded Type I ELMy H-mode experiments have been used to
estimate the W sputtering flux from divertor targets in ELM
and inter-ELM conditions. Comparison with similar estimates
using W I spectroscopy measurements shows a reasonable
agreement for the ELM and inter-ELM W source. The main
advantage of the method involving LP measurements is the
very high time resolution of the diagnostic (~10 μs)
allowing very precise description of the W sputtering source
during ELMs.},
cin = {IEK-4 / ZEA-2},
ddc = {530},
cid = {I:(DE-Juel1)IEK-4-20101013 / I:(DE-Juel1)ZEA-2-20090406},
pnm = {174 - Plasma-Wall-Interaction (POF3-174)},
pid = {G:(DE-HGF)POF3-174},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000383504700006},
doi = {10.1088/0031-8949/2015/T167/014005},
url = {https://juser.fz-juelich.de/record/281587},
}