Conference Presentation (Other)

FZJ-2016-01522

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Structural Study of Weak Topological Insulator Bi1Te1 Films on Si(111) grown by Molecular Beam Epitaxy

Lanius, M. (Corresponding author)FZJ* ; Eschbach, M.FZJ* ; Mlynczak, E.FZJ* ; Kellner, J. ; Gospodaric, P.FZJ* ; Niu, C.FZJ* ; Neumann, E.PGI-8-PT* ; Luysberg, M.FZJ* ; Mussler, G.FZJ* ; Plucinski, L.FZJ* ; Bihlmayer, G.FZJ* ; Blügel, S.FZJ* ; Morgenstern, M. ; Schneider, C. M.FZJ* ; Grützmacher, D.FZJ*

2016

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Contributing Institute(s):

1. Quanten-Theorie der Materialien (IAS-1)
2. Quanten-Theorie der Materialien (PGI-1)
3. JARA-FIT (JARA-FIT)
4. Elektronische Eigenschaften (PGI-6)
5. Halbleiter-Nanoelektronik (PGI-9)
6. Mikrostrukturforschung (PGI-5)
7. PGI-8-PT (PGI-8-PT)

Research Program(s):

1. 142 - Controlling Spin-Based Phenomena (POF3-142) (POF3-142)
2. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)

Appears in the scientific report 2016

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Database coverage:
No Authors Fulltext

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